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2017 International Mixed Signals Testing Workshop (IMSTW).

Author: IEEE Staff
Publisher: Piscataway : IEEE July 2017.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
Mixed signal circuits are both necessary and ubiquitous Data converters, RF transceivers, filters, PLLs, power regulators, voltage references, MEMS, instrumentation amplifiers, sensor interfaces The list of non digital blocks in modern Systems on Chips can be very large and all these circuits face the same quality and reliability requirements as the digital ones Despite many years of effort, the test and diagnosis  Read more...
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Genre/Form: Electronic book
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: IEEE Staff
ISBN: 9781538618141 1538618141
OCLC Number: 1012453386
Target Audience: Scholarly & Professional
Description: 1 online resource.

Abstract:

Mixed signal circuits are both necessary and ubiquitous Data converters, RF transceivers, filters, PLLs, power regulators, voltage references, MEMS, instrumentation amplifiers, sensor interfaces The list of non digital blocks in modern Systems on Chips can be very large and all these circuits face the same quality and reliability requirements as the digital ones Despite many years of effort, the test and diagnosis of analog, mixed signal, and RF (AMS RF) circuits and MEMS remains an open and compelling research problem Generic solutions are still lacking and the golden industrial practice is mainly specification based This can represent a significant cost for high performance circuits and it has been observed that specification based test can be insufficient to detect latent defects that may result in reliability issues for critical applications IMSTW is a forum that brings together the test community to discuss novel ideas for this challenge.

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