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2017 Joint International Symposium on e Manufacturing and Design Collaboration (eMDC) and Semiconductor Manufacturing (ISSM). Preview this item
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2017 Joint International Symposium on e Manufacturing and Design Collaboration (eMDC) and Semiconductor Manufacturing (ISSM).

Author: IEEE Staff,
Publisher: Piscataway : IEEE Sept. 2017.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
In collaboration with ISSM, this joint Symposium attends to recent technological advancements to align the needs of designers, manufacturers, equipment suppliers, software vendors, solution providers and researchers It offers a public arena for the exchange of up to date experiences among manufacturers for adoption of technological developments.
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Genre/Form: Electronic books
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: IEEE Staff,
ISBN: 9781538612163 153861216X
OCLC Number: 1016319687
Target Audience: Scholarly & Professional
Description: 1 online resource

Abstract:

In collaboration with ISSM, this joint Symposium attends to recent technological advancements to align the needs of designers, manufacturers, equipment suppliers, software vendors, solution providers and researchers It offers a public arena for the exchange of up to date experiences among manufacturers for adoption of technological developments.

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\n\n

Primary Entity<\/h3>\n
<http:\/\/www.worldcat.org\/oclc\/1016319687<\/a>> # 2017 Joint International Symposium on e Manufacturing and Design Collaboration (eMDC) and Semiconductor Manufacturing (ISSM).<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:CreativeWork<\/a>, schema:Book<\/a>, schema:MediaObject<\/a> ;\u00A0\u00A0\u00A0\nlibrary:oclcnum<\/a> \"1016319687<\/span>\" ;\u00A0\u00A0\u00A0\nlibrary:placeOfPublication<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/4681254662#Place\/piscataway<\/a>> ; # Piscataway<\/span>\n\u00A0\u00A0\u00A0\nlibrary:placeOfPublication<\/a> <http:\/\/id.loc.gov\/vocabulary\/countries\/nju<\/a>> ;\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/4681254662#Topic\/semiconductors<\/a>> ; # Semiconductors<\/span>\n\u00A0\u00A0\u00A0\nschema:author<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/4681254662#Organization\/ieee_staff<\/a>> ; # IEEE Staff,<\/span>\n\u00A0\u00A0\u00A0\nschema:bookFormat<\/a> schema:EBook<\/a> ;\u00A0\u00A0\u00A0\nschema:contentRating<\/a> \"Scholarly & Professional<\/span>\" ;\u00A0\u00A0\u00A0\nschema:datePublished<\/a> \"Set. 2017<\/span>\" ;\u00A0\u00A0\u00A0\nschema:description<\/a> \"In collaboration with ISSM, this joint Symposium attends to recent technological advancements to align the needs of designers, manufacturers, equipment suppliers, software vendors, solution providers and researchers It offers a public arena for the exchange of up to date experiences among manufacturers for adoption of technological developments.<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\nschema:exampleOfWork<\/a> <http:\/\/worldcat.org\/entity\/work\/id\/4681254662<\/a>> ;\u00A0\u00A0\u00A0\nschema:genre<\/a> \"Electronic books<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\nschema:inLanguage<\/a> \"en<\/span>\" ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"2017 Joint International Symposium on e Manufacturing and Design Collaboration (eMDC) and Semiconductor Manufacturing (ISSM).<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\nschema:productID<\/a> \"1016319687<\/span>\" ;\u00A0\u00A0\u00A0\nschema:publication<\/a> <http:\/\/www.worldcat.org\/title\/-\/oclc\/1016319687#PublicationEvent\/piscataway_ieeesept_2017<\/a>> ;\u00A0\u00A0\u00A0\nschema:publisher<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/4681254662#Agent\/ieee<\/a>> ; # IEEE<\/span>\n\u00A0\u00A0\u00A0\nschema:url<\/a> <https:\/\/ieeexplore.ieee.org\/servlet\/opac?punumber=8078142<\/a>> ;\u00A0\u00A0\u00A0\nschema:url<\/a> <http:\/\/ieeexplore.ieee.org\/servlet\/opac?punumber=8078142<\/a>> ;\u00A0\u00A0\u00A0\nschema:url<\/a> <http:\/\/VH7QX3XE2P.search.serialssolutions.com\/?V=1.0&L=VH7QX3XE2P&S=JCs&C=TC0001949370&T=marc&tab=BOOKS<\/a>> ;\u00A0\u00A0\u00A0\nschema:workExample<\/a> <http:\/\/worldcat.org\/isbn\/9781538612163<\/a>> ;\u00A0\u00A0\u00A0\nwdrs:describedby<\/a> <http:\/\/www.worldcat.org\/title\/-\/oclc\/1016319687<\/a>> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n\n

Related Entities<\/h3>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/4681254662#Agent\/ieee<\/a>> # IEEE<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nbgn:Agent<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"IEEE<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/4681254662#Organization\/ieee_staff<\/a>> # IEEE Staff,<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Organization<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"IEEE Staff,<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/4681254662#Place\/piscataway<\/a>> # Piscataway<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Place<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Piscataway<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/4681254662#Topic\/semiconductors<\/a>> # Semiconductors<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Semiconductors<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/id.loc.gov\/vocabulary\/countries\/nju<\/a>>\u00A0\u00A0\u00A0\u00A0a \nschema:Place<\/a> ;\u00A0\u00A0\u00A0\ndcterms:identifier<\/a> \"nju<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/worldcat.org\/isbn\/9781538612163<\/a>>\u00A0\u00A0\u00A0\u00A0a \nschema:ProductModel<\/a> ;\u00A0\u00A0\u00A0\nschema:isbn<\/a> \"153861216X<\/span>\" ;\u00A0\u00A0\u00A0\nschema:isbn<\/a> \"9781538612163<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/www.worldcat.org\/title\/-\/oclc\/1016319687<\/a>>\u00A0\u00A0\u00A0\u00A0a \ngenont:InformationResource<\/a>, genont:ContentTypeGenericResource<\/a> ;\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/www.worldcat.org\/oclc\/1016319687<\/a>> ; # 2017 Joint International Symposium on e Manufacturing and Design Collaboration (eMDC) and Semiconductor Manufacturing (ISSM).<\/span>\n\u00A0\u00A0\u00A0\nschema:dateModified<\/a> \"2019-09-06<\/span>\" ;\u00A0\u00A0\u00A0\nvoid:inDataset<\/a> <http:\/\/purl.oclc.org\/dataset\/WorldCat<\/a>> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/www.worldcat.org\/title\/-\/oclc\/1016319687#PublicationEvent\/piscataway_ieeesept_2017<\/a>>\u00A0\u00A0\u00A0\u00A0a \nschema:PublicationEvent<\/a> ;\u00A0\u00A0\u00A0\nschema:location<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/4681254662#Place\/piscataway<\/a>> ; # Piscataway<\/span>\n\u00A0\u00A0\u00A0\nschema:organizer<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/4681254662#Agent\/ieee<\/a>> ; # IEEE<\/span>\n\u00A0\u00A0\u00A0\nschema:startDate<\/a> \"Set. 2017<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n\n

Content-negotiable representations<\/p>\n