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2018 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) : August 13-17, 2018, Hangzhou, China : conference proceedings

Author: Maio Yu; Zhankun Weng; Zhejiang da xue,; Institute of Electrical and Electronics Engineers,
Publisher: [Piscataway, New Jersey] : IEEE, [2018] ©2018
Edition/Format:   eBook : Document : Conference publication : English
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Maio Yu; Zhankun Weng; Zhejiang da xue,; Institute of Electrical and Electronics Engineers,
OCLC Number: 1078916319
Notes: "IEEE Catalog Number: CFP183MN-ART."
Description: 1 online resource : illustrations
Other Titles: 3M-NANO 2018
Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2018 IEEE International Conference on 13-17 August, Hangzhou
8th International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale
IEEE 3M-NANO 2018
Responsibility: edited by: Maio Yu, Zhankun Weng ; organized by: Zhejiang University, China [and 10 others]

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