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25th IEEE VLSI Test Symposium : proceedings : 6-10 May, 2007, Berkeley, California Preview this item
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25th IEEE VLSI Test Symposium : proceedings : 6-10 May, 2007, Berkeley, California

Author: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers.
Publisher: Los Alamitos, Calif. : IEEE Computer Society, ©2007.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Print version:
IEEE VLSI Test Symposium (25th : 2007 : Berkeley, Calif.).
25th IEEE VLSI Test Symposium.
Los Alamitos, Calif. : IEEE Computer Society, ©2007
(OCoLC)138284265
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: IEEE Computer Society. Test Technology Technical Committee.; Institute of Electrical and Electronics Engineers.
OCLC Number: 143990162
Notes: "IEEE Computer Society Order Number P2812"--Title page verso.
Description: 1 online resource (xxx, 484 pages : illustrations)
Other Titles: Twenty fifth IEEE VLSI Test Symposium
VTS 2007
VTS 07
VLSI Test Symposium, 2007, 25th IEEE
Responsibility: [sponsored by] IEEE Computer Society.

Abstract:

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VTS 2007 focuses on innovation in the field of testing of integrated circuits and systems. The core of VTS 2007 explores the many trends and challenges in the semiconductor design and manufacturing industries with papers covering a diverse and seminal set of topics including, RF and Analog Test, Delay Test, Memory Test, Diagnosis, Online Test, SOC Test, and Fault Prediction and Evaluation. The proceedings features special sessions and covers innovative practices highlighting cutting-edge challenges faced by test practitioners and innovative solutions.Contents: RF Test; Delay Test Quality; Memory Test; Test Compression; Going after Defects; Online Test; Diagnosis; ATPG for Delay Faults; Advances in Test; Failure Estimation; Fault Prediction & Evaluation; Analog Test; High Level Test Techniques; Memory Repair; SOC Test; Design for Test; Testing Large Chips; Ensuring Secure Chips.

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Primary Entity<\/h3>\n
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