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Applied probability and queues

Author: Søren Asmussen
Publisher: New York : Springer, ©2003.
Series: Applications of mathematics, 51.
Edition/Format:   Print book : English : 2nd edView all editions and formats
Summary:
"This book serves as an introduction to queueing theory and provides a thorough treatment of tools such as Markov processes, renewal theory, random walks, Levy processes, matric-analytic methods, and change of measure. It also treats in detail basic structures like GI/G/1 and GI/G/s queues, Markov-modulated models, and queueing networks, and gives an introduction to areas such as storage, inventory, and insurance  Read more...
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Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Søren Asmussen
ISBN: 0387002111 9780387002118 9781441918093 1441918094
OCLC Number: 51060198
Description: xii, 438 pages : illustrations ; 24 cm.
Contents: Part A. Simple Markovian models --
I. Markov chains --
II. Markov jump processes --
III. Queueing theory at the Markovian level --
IV. Queueing networks and insensitivity --
Part B. Some general tools and methods --
V. Renewal theory --
VI. Regenerative processes --
VII. Further topics in renewal theory and regenerative processes --
VIII. Random walks --
IX. Lévy processes, reflection and duality --
Part C. Special models and methods --
X. Steady-state properties of GI/G/1 --
XI. Markov additive models --
XII. Many-server queues --
XIII. Exponential change of measure --
XIV. Dams, inventories and insurance risk.
Series Title: Applications of mathematics, 51.
Responsibility: Søren Asmussen.
More information:

Abstract:

"This book is a highly recommendable survey of mathematical tools and results in applied probability with special emphasis on queueing theory....The second edition at hand is a thoroughly updated and  Read more...

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From the reviews:"The author has substantially extended and updated the material to reflect developments over the period. ... The book is mainly aimed at academics and researchers, but should appeal Read more...

 
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