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Automated Visual Inspection and Machine Vision II

Author: Jürgen Beyerer; SPIE (Society)
Publisher: Bellingham, Washington : SPIE, [2017] copyright 2017
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 10334.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Summary:

Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

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Genre/Form: Electronic book
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Jürgen Beyerer; SPIE (Society)
OCLC Number: 1012442943
Description: 1 online resource : illustrations
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 10334.
Responsibility: Jürgen Beyerer.

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