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A BASIC program for calculating dopant density profiles from capacitance-voltage data

Author: Richard L Mattis; Martin G Buehler; United States. National Bureau of Standards.
Publisher: Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1975.
Series: Semiconductor measurement technology.; NBS special publication, 400-11.
Edition/Format:   Print book : National government publication : EnglishView all editions and formats
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Additional Physical Format: Online version:
Mattis, Richard L.
BASIC program for calculating dopant density profiles from capacitance-voltage data.
Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1975
(OCoLC)648362046
Material Type: Government publication, National government publication
Document Type: Book
All Authors / Contributors: Richard L Mattis; Martin G Buehler; United States. National Bureau of Standards.
OCLC Number: 1323497
Description: v, 33 pages : illustrations ; 26 cm.
Series Title: Semiconductor measurement technology.; NBS special publication, 400-11.
Responsibility: Richard L. Mattis and Martin G. Buehler.

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