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BEC 2006 : 2006 International Baltic Electronics Conference : proceedings of the 10th biennial Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia

Author: Tallinna Tehnikaülikool. Department of Electronics.; IEEE Circuits and Systems Society.
Publisher: Piscataway, NJ : IEEE, ©2006.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Genre/Form: Electronic book
Electronic books
Conference papers and proceedings
Congresses
Additional Physical Format: Print version:
Baltic Electronics Conference (10th : 2006 : Tallinn, Estonia).
BEC 2006.
Piscataway, NJ : IEEE, ©2006
(DLC) 2006925555
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Tallinna Tehnikaülikool. Department of Electronics.; IEEE Circuits and Systems Society.
ISBN: 1424404142 9781424404148 1424404150 9781424404155
OCLC Number: 122952919
Language Note: English.
Notes: "IEEE catalog number: 06EX1395"--Title page verso.
Description: 1 online resource (248 pages) : illustrations
Contents: Machine derived contents note: Invited Talks --
On the incoherence of quantum transport in semiconductor heterostructure --
optoelectronic devices 11 --
P. Harrison, Z. Ikoni6, N. Vukmirovic, D. Indjin, R.W. Kelsall and V.D. Jovanovie, --
University ofLeeds, U.K. --
Development of a Commercially Viable 4H-SiC PiN Diode Technology 19 --
Mrinal K. Das, Cree, Inc., USA --
Thermal qualification of 3D stacked die structures 23 --
Marta Rencz, Budapest University of Technology and Economics, Hungary --
SoC Specification using UML and Actor-Oriented Modeling 31 --
Leandro Soares Indrusiak, Manfred Glesner, Darmstadt University of Technology, Germany --
1. Electronic Materials, Devices, and Simulation --
Local oxidation process simulation in nanoscale MOS/CMOS structures 37 --
D. Andriukaitis, R. Anilionis --
VMOS, UMOS structures simulation in micro and nano scale 41 --
T. Kersys, D. Andriukaitis, R. Anilionis --
The model of the p-n junction depletion region v-i characteristic considering --
the dependence of concentration of majority carriers on voltage 45 --
A. Baskys --
The basic Schottky parameters for combined diffusion welded and sputter --
metal contacts 47 --
N Kuznetsova, 0. Korolkov, T. Rang and M Pikkov --
Numerical investigation of digitised parabolic quantum wells for terahertz --
A lG aA s/G aA s structures 51 --
R. Reeder, A. Udal, E. Velmre, P. Harrison --
Clamp mode package diffusion welded power SiC Schottky diodes 55 --
0. Korolkov, N Kuznetsova and T. Rang --
Static and dynamic behavior of the SiC complementary JBS structures 59 --
Raido Kurel, Toomas Rang --
Contact free potential mapping by vibrating capacitor 63 --
J. Mizsei --
On emerging nanodevices and architectures 67 --
J. Flak, M Laiho, K Halonen --
Possibilities of applying the Microwave Office program package to the investigation --
of helical delay sy stem s 7 1 --
J. Skudutis, V Daskevicius --
Methods of simulation of the gutter-type helical system 75 --
T. Burokas, V Daskevicius, J. Skudutis, S. Staras --
Electric Field Potential Interpolation 79 --
D. Navikas, P. Tarvydas, A. Noreika --
Electric Field Modeling Performance Analysis 83 --
P. Tarvydas, V. MarkevidYius, A. Noreika --
2. Integrated Electronics and Chip Design --
Improved VHDL Input for High-Level Synthesis Tool xTractor 87 --
Peeter Ellervee, Eero Ivask, Margus Kruus --
A Generic Synthesizable NoC Switch with a Scalable Testbench : 91 --
Vineeth Govind, Jaan Raik, Raimund Ubar --
A RTL Asynchronous FIFO Design Using Modified Micropipeline 95 --
Xin Wang, Jari Nurmi --
Open Source On-Chip Logic Analyzer for FPGA-s 99 --
Lauri Ehrenpreis, Peeter Ellervee, Kalle Tammemde --
Noise analysis of comparator performed sine-to-square conversion 103 --
L. Aaltonen, M. Saukoski, I. Teikari and K. Halonen --
Low power successive approximation A/D converter for passive RFID tag sensors 107 --
J. Marjonen, R. Alaoja, H. Ronkainen, M Aberg --
Behavioral Model based Simulation Methods for Charge-Pump PLL's 111 --
Tapio Rapinoja, Kari Stadius and Kari Halonen --
Ultra low noise low power LDO design 115 --
Vello Mannama, Rein Sabolotny, Viktor Strik --
Genetic algorithm based non-polynomial LUT update method for phase-amplitude --
RF predistortion 119 --
lari Teikari, Kari Halonen --
Bandgap voltage reference: errors and techniques for their minimization 123 --
S. Strik --
A fully integrated Gm-C oscillator for readout of a force balanced accelerometer 127 --
P Rahikkala, L. Aaltonen, K. Halonen --
Graph Embedding in Boolean Hypercube 131 --
Đ dZakreski --
3. Systems, Instrumentation and Communication --
The Single Dimensional Edge Detection Method for the Intelligent Image sensor 135 --
J. Tfeftik, J. Fischer --
Multi-Biometric Techniques, Standards Activities and Experimenting 137 --
Rudolf Volner, Petr BoreS --
Performance Estimation for M IM O channel 141 --
G. Balodis, A. Sozontovs, B. Zuga, I. Slaidins --
Controller for plans with the asymmetric dynamics 145 --
A. Baskys, V Zlosnikas --
Self-organization in Ad Hoc Wireless Networks 149 --
Toomas Kirt, Aivo Anier --
Broadcast in near-field region of transmitter antenna 153 --
A. Taklaja, S. Reisberg --
Establishment of National Standard of Voltage Unit in Estonia 157 --
A. Pokatilov, T. Kiibarsepp --
Development of Automated Measurement Setup for Standard Resistors 161 --
A. Pokatilov, T Kiibarsepp --
Testing of Middle-resolution Digitisers at Input Signal Frequency of 1 MHz 163 --
Vladimir Haasz, Milan Komdrek, Jaroslav Roztodil, Petr Suchdnek --
Practical aspects of dynamic ADC testing in frequency range 1 to 20 MHz 167 --
Petr Suchdnek, Milan Komarek, Vladimir Haasz --
Portable FTIR spectrom eter 169 --
T. T6nnisson --
4. Test, Diagnostics, and Fault Tolerance --
Testability Analysis of Digital Design Verification 171 --
V. Hahanov, M Kaminska and E. Fomina --
A Tool for Advanced Learning of LFSR-Based Testing Principles 175 --
A. Jutman, A. Tsertov, R. Ubar --
LFSR Polynomial and Seed Selection Using Genetic Algorithm 179 --
E. Aleksejev, A. Jutman, R. Ubar --
Self-Testing Checker Design for arbitrary number of code words of (m, n) code 183 --
Yu. B. Burkatovskaya, N B. Butorina, A. Yu. Matrosova --
A tool for teaching memory testing based on BIST 187 --
M6ria Fischerovad, Tom6g Pikula, Martin SimlaStik, Alberto Bosio, --
Stefano di Carlo, Giorgio di Natale --
TTBist: a DfT Tool for Enhancing Functional Test for SoC 191 --
K. Hermann, J. Raik, M Jenihhin --
Distributed Genetic Algorithm of Test Generation For Digital Circuits 195 --
Skobtsov YA., El-Khatib A.I., Ivanov D.E. --
Optimization of the Store-and-Generate Based Built-in Self-Test 199 --
R. Ubar, G. Jervan, H. Kruus, E. Orasson, I Aleksejev --
Automated XML-based Test Modelling For Mixed-Signal Circuits 203 --
A. Mellik --
Functional Test Generation for Finite State Machines 205 --
R. Ubar, M Brik, A. Jutman, J. Raik, T. Bengtsson, S. Kumar --
5. Biomedical Electronics --
Modeling in the Bioimpedance Measurement Techniques Using --
G eneral-Purpose Softw are 209 --
Toivo Paavle --
Simulation of Intra-Cardiac Complex Impedance Signals for Developing --
Simple Bio-impedance Models for Cardio-Dynamics 213 --
Rauno Gordon --
Multifrequency Vector Impedance Measurement: Undersampled DFT --
with Noise Pre-filtering 217 --
0. Martens, M Min --
Ischemic stroke region recognition based on ray tracing 221 --
A. Usinskas, R. Gleizniene --
A Bio-Impedance Signal Synthesiser (BISS) for Testing of an Adaptive --
Filtering System 225 --
A. Krivoshei --
6. Power Electronics --
A new high power factor single-phase diode rectifier with optimum --
ripple-power conversion 229 --
T. Sakkos, V Sarv --
Bus bar test bench development for common 3x3 matrix converter 233 --
A. Sokolovs, I Galkin, J. Laugis --
Outlook of usage of supercapacitors in uninterruptible power supplies 237 --
I. Galkin, A. Stepanov, J. Laugis --
Isolated DC/DC Converter Topology with a Three-Phase Intermediate AC-Link 241 --
D. Vinnikov --
SiC Schottky Diode for Use in Power Convertors 245 --
M Pikkov, T. Rang, A. Pokatilov.
Other Titles: 2006 International Baltic Electronics Conference
Responsibility: organized by Department of Electronics of Tallinn University of Technology ; in cooperation with Faculty of Information Technology ; technically co-sponsored by IEEE Circuits and Systems Society.

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