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Comprehensive functional verification : the complete industry cycle

Author: Bruce Wile; John C Goss; Wolfgang Roesner
Publisher: Amsterdam : Elsevier, Morgan Kaufmann, 2005.
Series: Morgan Kaufmann series in systems on silicon.
Edition/Format:   Print book : EnglishView all editions and formats
Summary:

One of challenges in chip and system design is determining whether the hardware works correctly. This book describes the verification cycle and details each stage. It follows the cycle, demonstrating  Read more...

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Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Bruce Wile; John C Goss; Wolfgang Roesner
ISBN: 0127518037 9780127518039
OCLC Number: 255405266
Notes: Literaturverz. S. [657] - 662.
Description: XXIII, 676 Seiten : Diagramme.
Contents: Part I: Introduction to Verification Chapter 1: Verification in the Chip Design Process Chapter 2: Verification Flow Chapter 3: Fundamentals of Simulation Based Verification Chapter 4: The Verification Plan Part II: Simulation-Based Verification Chapter 5: HDLs and Simulation Engines Chapter 6: Creating Environments Chapter 7: Strategies for Simulation-based Stimulus Generation Chapter 8: Strategies for Results Checking in Chapter 9: Pervasive Function Verification Chapter 10: Re-Use Strategies and System Simulation Part III: Formal Verification Chapter 11 Introduction to Formal Verification Chapter 12 Using Formal Verification Part IV: Comprehensive Verification Chapter 13: Completing the Verification Cycle Chapter 14: Advanced Verification Techniques Part V: Case Studies Chapter 15: Case Studies Glossary References
Series Title: Morgan Kaufmann series in systems on silicon.
Responsibility: Bruce Wile ; John C. Goss ; Wolfgang Roesner.
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Primary Entity<\/h3>
<http:\/\/www.worldcat.org\/oclc\/255405266<\/a>> # Comprehensive functional verification : the complete industry cycle<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Book<\/a>, schema:CreativeWork<\/a> ;\u00A0\u00A0\u00A0library:oclcnum<\/a> \"255405266<\/span>\" ;\u00A0\u00A0\u00A0library:placeOfPublication<\/a> <http:\/\/id.loc.gov\/vocabulary\/countries\/ne<\/a>> ;\u00A0\u00A0\u00A0library:placeOfPublication<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/865228#Place\/amsterdam<\/a>> ; # Amsterdam<\/span>\u00A0\u00A0\u00A0schema:about<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/865228#Topic\/integrated_circuits_verification<\/a>> ; # Integrated circuits--Verification<\/span>\u00A0\u00A0\u00A0schema:about<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/865228#Topic\/mikroelektronik_swd_id_40392077<\/a>> ; # Mikroelektronik ; SWD-ID: 40392077<\/span>\u00A0\u00A0\u00A0schema:about<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/865228#Topic\/computer_engineering<\/a>> ; # Computer engineering<\/span>\u00A0\u00A0\u00A0schema:about<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/865228#Topic\/hardwareverifikation_swd_id_42149824<\/a>> ; # Hardwareverifikation ; SWD-ID: 42149824<\/span>\u00A0\u00A0\u00A0schema:about<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/865228#Topic\/mikroelektronik<\/a>> ; # Mikroelektronik<\/span>\u00A0\u00A0\u00A0schema:about<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/865228#Topic\/hardwareverifikation<\/a>> ; # Hardwareverifikation<\/span>\u00A0\u00A0\u00A0schema:about<\/a> <http:\/\/dewey.info\/class\/621.381548\/<\/a>> ;\u00A0\u00A0\u00A0schema:about<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/865228#Topic\/integrierte_schaltung<\/a>> ; # Integrierte Schaltung<\/span>\u00A0\u00A0\u00A0schema:bookFormat<\/a> bgn:PrintBook<\/a> ;\u00A0\u00A0\u00A0schema:contributor<\/a> <http:\/\/viaf.org\/viaf\/220536494<\/a>> ; # John C. Goss<\/span>\u00A0\u00A0\u00A0schema:contributor<\/a> <http:\/\/viaf.org\/viaf\/221155298<\/a>> ; # Wolfgang Roesner<\/span>\u00A0\u00A0\u00A0schema:creator<\/a> <http:\/\/viaf.org\/viaf\/26800139<\/a>> ; # Bruce Wile<\/span>\u00A0\u00A0\u00A0schema:datePublished<\/a> \"2005<\/span>\" ;\u00A0\u00A0\u00A0schema:exampleOfWork<\/a> <http:\/\/worldcat.org\/entity\/work\/id\/865228<\/a>> ;\u00A0\u00A0\u00A0schema:inLanguage<\/a> \"en<\/span>\" ;\u00A0\u00A0\u00A0schema:isPartOf<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/865228#Series\/the_morgan_kaufmann_series_in_systems_on_silicon<\/a>> ; # The Morgan Kaufmann series in systems on silicon<\/span>\u00A0\u00A0\u00A0schema:isPartOf<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/865228#Series\/morgan_kaufmann_series_in_systems_on_silicon<\/a>> ; # Morgan Kaufmann series in systems on silicon.<\/span>\u00A0\u00A0\u00A0schema:name<\/a> \"Comprehensive functional verification : the complete industry cycle<\/span>\" ;\u00A0\u00A0\u00A0schema:productID<\/a> \"255405266<\/span>\" ;\u00A0\u00A0\u00A0schema:publication<\/a> <http:\/\/www.worldcat.org\/title\/-\/oclc\/255405266#PublicationEvent\/amsterdam_elsevier_morgan_kaufmann_2005<\/a>> ;\u00A0\u00A0\u00A0schema:publisher<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/865228#Agent\/elsevier_morgan_kaufmann<\/a>> ; # Elsevier, Morgan Kaufmann<\/span>\u00A0\u00A0\u00A0schema:url<\/a> <http:\/\/bvbr.bib-bvb.de:8991\/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=017440408&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA<\/a>> ;\u00A0\u00A0\u00A0schema:url<\/a> <http:\/\/catdir.loc.gov\/catdir\/enhancements\/fy0627\/2005299338-t.html<\/a>> ;\u00A0\u00A0\u00A0schema:url<\/a> <http:\/\/catdir.loc.gov\/catdir\/enhancements\/fy0627\/2005299338-d.html<\/a>> ;\u00A0\u00A0\u00A0schema:workExample<\/a> <http:\/\/worldcat.org\/isbn\/9780127518039<\/a>> ;\u00A0\u00A0\u00A0wdrs:describedby<\/a> <http:\/\/www.worldcat.org\/title\/-\/oclc\/255405266<\/a>> ;\u00A0\u00A0\u00A0\u00A0.<\/div>

Related Entities<\/h3>
<http:\/\/dewey.info\/class\/621.381548\/<\/a>>\u00A0\u00A0\u00A0\u00A0a schema:Intangible<\/a> ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/865228#Agent\/elsevier_morgan_kaufmann<\/a>> # Elsevier, Morgan Kaufmann<\/span>\u00A0\u00A0\u00A0\u00A0a bgn:Agent<\/a> ;\u00A0\u00A0\u00A0schema:name<\/a> \"Elsevier, Morgan Kaufmann<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/865228#Place\/amsterdam<\/a>> # Amsterdam<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Place<\/a> ;\u00A0\u00A0\u00A0schema:name<\/a> \"Amsterdam<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/865228#Series\/morgan_kaufmann_series_in_systems_on_silicon<\/a>> # Morgan Kaufmann series in systems on silicon.<\/span>\u00A0\u00A0\u00A0\u00A0a bgn:PublicationSeries<\/a> ;\u00A0\u00A0\u00A0schema:hasPart<\/a> <http:\/\/www.worldcat.org\/oclc\/255405266<\/a>> ; # Comprehensive functional verification : the complete industry cycle<\/span>\u00A0\u00A0\u00A0schema:name<\/a> \"Morgan Kaufmann series in systems on silicon.<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/865228#Series\/the_morgan_kaufmann_series_in_systems_on_silicon<\/a>> # The Morgan Kaufmann series in systems on silicon<\/span>\u00A0\u00A0\u00A0\u00A0a bgn:PublicationSeries<\/a> ;\u00A0\u00A0\u00A0schema:hasPart<\/a> <http:\/\/www.worldcat.org\/oclc\/255405266<\/a>> ; # Comprehensive functional verification : the complete industry cycle<\/span>\u00A0\u00A0\u00A0schema:name<\/a> \"The Morgan Kaufmann series in systems on silicon<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/865228#Topic\/computer_engineering<\/a>> # Computer engineering<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Intangible<\/a> ;\u00A0\u00A0\u00A0schema:name<\/a> \"Computer engineering<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/865228#Topic\/hardwareverifikation<\/a>> # Hardwareverifikation<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Intangible<\/a> ;\u00A0\u00A0\u00A0schema:name<\/a> \"Hardwareverifikation<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/865228#Topic\/hardwareverifikation_swd_id_42149824<\/a>> # Hardwareverifikation ; SWD-ID: 42149824<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Intangible<\/a> ;\u00A0\u00A0\u00A0schema:name<\/a> \"Hardwareverifikation ; SWD-ID: 42149824<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/865228#Topic\/integrated_circuits_verification<\/a>> # Integrated circuits--Verification<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Intangible<\/a> ;\u00A0\u00A0\u00A0schema:name<\/a> \"Integrated circuits--Verification<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/865228#Topic\/integrierte_schaltung<\/a>> # Integrierte Schaltung<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Intangible<\/a> ;\u00A0\u00A0\u00A0schema:name<\/a> \"Integrierte Schaltung<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/865228#Topic\/mikroelektronik<\/a>> # Mikroelektronik<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Intangible<\/a> ;\u00A0\u00A0\u00A0schema:name<\/a> \"Mikroelektronik<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/865228#Topic\/mikroelektronik_swd_id_40392077<\/a>> # Mikroelektronik ; SWD-ID: 40392077<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Intangible<\/a> ;\u00A0\u00A0\u00A0schema:name<\/a> \"Mikroelektronik ; SWD-ID: 40392077<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/id.loc.gov\/vocabulary\/countries\/ne<\/a>>\u00A0\u00A0\u00A0\u00A0a schema:Place<\/a> ;\u00A0\u00A0\u00A0dcterms:identifier<\/a> \"ne<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/viaf.org\/viaf\/220536494<\/a>> # John C. Goss<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Person<\/a> ;\u00A0\u00A0\u00A0schema:familyName<\/a> \"Goss<\/span>\" ;\u00A0\u00A0\u00A0schema:givenName<\/a> \"John C.<\/span>\" ;\u00A0\u00A0\u00A0schema:name<\/a> \"John C. Goss<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/viaf.org\/viaf\/221155298<\/a>> # Wolfgang Roesner<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Person<\/a> ;\u00A0\u00A0\u00A0schema:familyName<\/a> \"Roesner<\/span>\" ;\u00A0\u00A0\u00A0schema:givenName<\/a> \"Wolfgang<\/span>\" ;\u00A0\u00A0\u00A0schema:name<\/a> \"Wolfgang Roesner<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/viaf.org\/viaf\/26800139<\/a>> # Bruce Wile<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Person<\/a> ;\u00A0\u00A0\u00A0schema:familyName<\/a> \"Wile<\/span>\" ;\u00A0\u00A0\u00A0schema:givenName<\/a> \"Bruce<\/span>\" ;\u00A0\u00A0\u00A0schema:name<\/a> \"Bruce Wile<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/worldcat.org\/isbn\/9780127518039<\/a>>\u00A0\u00A0\u00A0\u00A0a schema:ProductModel<\/a> ;\u00A0\u00A0\u00A0schema:isbn<\/a> \"0127518037<\/span>\" ;\u00A0\u00A0\u00A0schema:isbn<\/a> \"9780127518039<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/www.worldcat.org\/title\/-\/oclc\/255405266<\/a>>\u00A0\u00A0\u00A0\u00A0a genont:InformationResource<\/a>, genont:ContentTypeGenericResource<\/a> ;\u00A0\u00A0\u00A0schema:about<\/a> <http:\/\/www.worldcat.org\/oclc\/255405266<\/a>> ; # Comprehensive functional verification : the complete industry cycle<\/span>\u00A0\u00A0\u00A0schema:dateModified<\/a> \"2018-11-09<\/span>\" ;\u00A0\u00A0\u00A0void:inDataset<\/a> <http:\/\/purl.oclc.org\/dataset\/WorldCat<\/a>> ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/www.worldcat.org\/title\/-\/oclc\/255405266#PublicationEvent\/amsterdam_elsevier_morgan_kaufmann_2005<\/a>>\u00A0\u00A0\u00A0\u00A0a schema:PublicationEvent<\/a> ;\u00A0\u00A0\u00A0schema:location<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/865228#Place\/amsterdam<\/a>> ; # Amsterdam<\/span>\u00A0\u00A0\u00A0schema:organizer<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/865228#Agent\/elsevier_morgan_kaufmann<\/a>> ; # Elsevier, Morgan Kaufmann<\/span>\u00A0\u00A0\u00A0schema:startDate<\/a> \"2005<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>

Content-negotiable representations<\/p>