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Conference, Exhibition and Management Seminar on the Automation of Testing,

Author: Institution of Electrical Engineers. Control and Automation Division.; Electronic Engineering Association.
Publisher: [London], [Institution of Electrical Engineers], [1972]
Series: Institution of Electrical Engineers.; IEE conference publication
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Institution of Electrical Engineers. Control and Automation Division.; Electronic Engineering Association.
OCLC Number: 1062562
Notes: Cover title: The automation of testing.
Organised by Control and Automation Division of the Institute of Electrical Engineers and Electronic Engineering Association, in association with others.
Description: vi, 226 pages illustrations 30 cm.
Series Title: Institution of Electrical Engineers.; IEE conference publication
Other Titles: Automation of testing
Responsibility: 20-22 Sept. 1972.

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Primary Entity

<http://www.worldcat.org/oclc/1062562> # Conference, Exhibition and Management Seminar on the Automation of Testing,
    a schema:Book, schema:CreativeWork ;
   library:oclcnum "1062562" ;
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/enk> ;
   library:placeOfPublication <http://dbpedia.org/resource/London> ; # London
   schema:about <http://experiment.worldcat.org/entity/work/data/3855316150#Topic/automation> ; # Automation
   schema:about <http://id.worldcat.org/fast/1148240> ; # Testing
   schema:about <http://experiment.worldcat.org/entity/work/data/3855316150#Topic/testing> ; # Testing
   schema:about <http://dewey.info/class/629.8/> ;
   schema:about <http://id.worldcat.org/fast/822786> ; # Automation
   schema:alternateName "Automation of testing" ;
   schema:bookFormat bgn:PrintBook ;
   schema:contributor <http://viaf.org/viaf/123857460> ; # Institution of Electrical Engineers. Control and Automation Division.
   schema:contributor <http://viaf.org/viaf/129618924> ; # Electronic Engineering Association.
   schema:creator <http://experiment.worldcat.org/entity/work/data/3855316150#Meeting/conference_exhibition_and_management_seminar_on_the_automation_of_testing_1972_university_of_keele_england> ; # Conference, Exhibition and Management Seminar on the Automation of Testing (1972 : University of Keele, England)
   schema:datePublished "1972" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/3855316150> ;
   schema:genre "Conference publication"@en ;
   schema:genre "Conference papers and proceedings"@en ;
   schema:inLanguage "en" ;
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/3855316150#Series/institution_of_electrical_engineers_iee_conference_publication> ; # Institution of Electrical Engineers. IEE conference publication,
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/3855316150#Series/iee_conference_publication> ; # IEE conference publication ;
   schema:name "Conference, Exhibition and Management Seminar on the Automation of Testing,"@en ;
   schema:productID "1062562" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/1062562#PublicationEvent/london_institution_of_electrical_engineers_1972> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/3855316150#Agent/institution_of_electrical_engineers> ; # [Institution of Electrical Engineers]
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/1062562> ;
    .


Related Entities

<http://dbpedia.org/resource/London> # London
    a schema:Place ;
   schema:name "London" ;
    .

<http://experiment.worldcat.org/entity/work/data/3855316150#Agent/institution_of_electrical_engineers> # [Institution of Electrical Engineers]
    a bgn:Agent ;
   schema:name "[Institution of Electrical Engineers]" ;
    .

<http://experiment.worldcat.org/entity/work/data/3855316150#Meeting/conference_exhibition_and_management_seminar_on_the_automation_of_testing_1972_university_of_keele_england> # Conference, Exhibition and Management Seminar on the Automation of Testing (1972 : University of Keele, England)
    a bgn:Meeting, schema:Event ;
   schema:location <http://experiment.worldcat.org/entity/work/data/3855316150#Place/university_of_keele_england> ; # University of Keele, England)
   schema:name "Conference, Exhibition and Management Seminar on the Automation of Testing (1972 : University of Keele, England)" ;
    .

<http://experiment.worldcat.org/entity/work/data/3855316150#Organization/institution_of_electrical_engineers> # Institution of Electrical Engineers.
    a schema:Organization ;
   schema:name "Institution of Electrical Engineers." ;
    .

<http://experiment.worldcat.org/entity/work/data/3855316150#Place/university_of_keele_england> # University of Keele, England)
    a schema:Place ;
   schema:name "University of Keele, England)" ;
    .

<http://experiment.worldcat.org/entity/work/data/3855316150#Series/iee_conference_publication> # IEE conference publication ;
    a bgn:PublicationSeries ;
   schema:creator <http://experiment.worldcat.org/entity/work/data/3855316150#Organization/institution_of_electrical_engineers> ; # Institution of Electrical Engineers.
   schema:hasPart <http://www.worldcat.org/oclc/1062562> ; # Conference, Exhibition and Management Seminar on the Automation of Testing,
   schema:name "IEE conference publication ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/3855316150#Series/institution_of_electrical_engineers_iee_conference_publication> # Institution of Electrical Engineers. IEE conference publication,
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/1062562> ; # Conference, Exhibition and Management Seminar on the Automation of Testing,
   schema:name "Institution of Electrical Engineers. IEE conference publication," ;
    .

<http://id.worldcat.org/fast/1148240> # Testing
    a schema:Intangible ;
   schema:name "Testing"@en ;
    .

<http://id.worldcat.org/fast/822786> # Automation
    a schema:Intangible ;
   schema:name "Automation"@en ;
    .

<http://viaf.org/viaf/123857460> # Institution of Electrical Engineers. Control and Automation Division.
    a schema:Organization ;
   schema:name "Institution of Electrical Engineers. Control and Automation Division." ;
    .

<http://viaf.org/viaf/129618924> # Electronic Engineering Association.
    a schema:Organization ;
   schema:name "Electronic Engineering Association." ;
    .


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