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Genre/Form: | Thèses et écrits académiques |
---|---|
Material Type: | Document, Thesis/dissertation, Internet resource |
Document Type: | Internet Resource, Computer File |
All Authors / Contributors: |
Adnan Saghir; Junwu Tao; Institut national polytechnique (Toulouse / 1969-....).; École doctorale Génie électrique, électronique et télécommunications (Toulouse). |
OCLC Number: | 876426894 |
Notes: | L'impression du document donne 121 p. Titre provenant de l'écran-titre. |
Description: | 1 online resource |
Responsibility: | Adnan Saghir ; sous la direction de Junwu Tao. |
Abstract:
The accurate knowledge of electromagnetic fields radiated by microwave devices requires instrumental tools for direct or indirect measurement of these fields. Near-field scan technique is one of those tools. This manuscript describes the work done to characterize electromagnetic probes using a near field scan platform developed in the laboratory LAPLACE. We focused our work on the electromagnetic simulation of test devices that are used in the deconvolution of antenna factor of magnetic or electric probes. These devices include both planar structures such as microstrip line and also waveguide components such as rectangular or circular open-ended waveguides. To analyze these structures, commercial software based on finite element method was used. In case of radiating structures, a program based on transverse operator method was developed. It allows the determination of the admittance of radiation and the radiated electromagnetic fields in near-field and far-field regions. The results were validated by simulations with commercial tools, and measurements made in the laboratory.
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