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Cumulative index to proceedings of the IEEE. Subject and author, 1960-1971. Preview this item
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Cumulative index to proceedings of the IEEE. Subject and author, 1960-1971.

Author: Nichigai Asoshiētsu.; Institute of Electrical and Electronics Engineers.
Publisher: [Tokyo] Nichigai Associates, in association with Institute of Electrical and Electronics Engineers [©1973]
Edition/Format:   Print book : English
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Genre/Form: Bibliography
Indexes
Document Type: Book
All Authors / Contributors: Nichigai Asoshiētsu.; Institute of Electrical and Electronics Engineers.
OCLC Number: 1105266
Description: 495 pages 29 cm
Contents: [1] Subject.--[2] Author.

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Primary Entity<\/h3>
<http:\/\/www.worldcat.org\/oclc\/1105266<\/a>> # Cumulative index to proceedings of the IEEE. Subject and author, 1960-1971.<\/span>\u00A0\u00A0\u00A0\u00A0a schema:CreativeWork<\/a>, schema:Book<\/a> ;\u00A0\u00A0\u00A0library:oclcnum<\/a> \"1105266<\/span>\" ;\u00A0\u00A0\u00A0library:placeOfPublication<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/19215199#Place\/tokyo<\/a>> ; # Tokyo<\/span>\u00A0\u00A0\u00A0library:placeOfPublication<\/a> <http:\/\/id.loc.gov\/vocabulary\/countries\/ja<\/a>> ;\u00A0\u00A0\u00A0schema:about<\/a> <http:\/\/dewey.info\/class\/621.3\/<\/a>> ;\u00A0\u00A0\u00A0schema:about<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/19215199#Organization\/institute_of_electrical_and_electronics_engineers<\/a>> ; # Institute of Electrical and Electronics Engineers.<\/span>\u00A0\u00A0\u00A0schema:about<\/a> <http:\/\/id.loc.gov\/authorities\/classification\/Z5832<\/a>> ;\u00A0\u00A0\u00A0schema:about<\/a> <http:\/\/id.loc.gov\/authorities\/subjects\/sh85041666<\/a>> ; # Electrical engineering<\/span>\u00A0\u00A0\u00A0schema:about<\/a> <http:\/\/viaf.org\/viaf\/123926298<\/a>> ; # Institute of Electrical and Electronics Engineers.<\/span>\u00A0\u00A0\u00A0schema:about<\/a> <http:\/\/dewey.info\/class\/016.621305\/<\/a>> ;\u00A0\u00A0\u00A0schema:about<\/a> <http:\/\/id.worldcat.org\/fast\/1728596<\/a>> ; # Electrical engineering<\/span>\u00A0\u00A0\u00A0schema:bookFormat<\/a> bgn:PrintBook<\/a> ;\u00A0\u00A0\u00A0schema:contributor<\/a> <http:\/\/viaf.org\/viaf\/123926298<\/a>> ; # Institute of Electrical and Electronics Engineers.<\/span>\u00A0\u00A0\u00A0schema:creator<\/a> <http:\/\/viaf.org\/viaf\/312145858148423022412<\/a>> ; # Nichigai Asoshi\u0113tsu.<\/span>\u00A0\u00A0\u00A0schema:datePublished<\/a> \"1973<\/span>\" ;\u00A0\u00A0\u00A0schema:description<\/a> \"[1] Subject.--[2] Author.<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0schema:exampleOfWork<\/a> <http:\/\/worldcat.org\/entity\/work\/id\/19215199<\/a>> ;\u00A0\u00A0\u00A0schema:genre<\/a> \"Bibliography<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0schema:genre<\/a> \"Indexes<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0schema:inLanguage<\/a> \"en<\/span>\" ;\u00A0\u00A0\u00A0schema:name<\/a> \"Cumulative index to proceedings of the IEEE. Subject and author, 1960-1971.<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0schema:productID<\/a> \"1105266<\/span>\" ;\u00A0\u00A0\u00A0schema:publication<\/a> <http:\/\/www.worldcat.org\/title\/-\/oclc\/1105266#PublicationEvent\/tokyonichigai_associates_in_association_with_institute_of_electrical_and_electronics_engineers_1973<\/a>> ;\u00A0\u00A0\u00A0schema:publisher<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/19215199#Agent\/nichigai_associates_in_association_with_institute_of_electrical_and_electronics_engineers<\/a>> ; # Nichigai Associates, in association with Institute of Electrical and Electronics Engineers<\/span>\u00A0\u00A0\u00A0wdrs:describedby<\/a> <http:\/\/www.worldcat.org\/title\/-\/oclc\/1105266<\/a>> ;\u00A0\u00A0\u00A0\u00A0.<\/div>

Related Entities<\/h3>
<http:\/\/dewey.info\/class\/016.621305\/<\/a>>\u00A0\u00A0\u00A0\u00A0a schema:Intangible<\/a> ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/dewey.info\/class\/621.3\/<\/a>>\u00A0\u00A0\u00A0\u00A0a schema:Intangible<\/a> ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/19215199#Agent\/nichigai_associates_in_association_with_institute_of_electrical_and_electronics_engineers<\/a>> # Nichigai Associates, in association with Institute of Electrical and Electronics Engineers<\/span>\u00A0\u00A0\u00A0\u00A0a bgn:Agent<\/a> ;\u00A0\u00A0\u00A0schema:name<\/a> \"Nichigai Associates, in association with Institute of Electrical and Electronics Engineers<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/19215199#Organization\/institute_of_electrical_and_electronics_engineers<\/a>> # Institute of Electrical and Electronics Engineers.<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Organization<\/a> ;\u00A0\u00A0\u00A0schema:name<\/a> \"Institute of Electrical and Electronics Engineers.<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/19215199#Place\/tokyo<\/a>> # Tokyo<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Place<\/a> ;\u00A0\u00A0\u00A0schema:name<\/a> \"Tokyo<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/id.loc.gov\/authorities\/classification\/Z5832<\/a>>\u00A0\u00A0\u00A0\u00A0a schema:Intangible<\/a> ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/id.loc.gov\/authorities\/subjects\/sh85041666<\/a>> # Electrical engineering<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Intangible<\/a> ;\u00A0\u00A0\u00A0schema:name<\/a> \"Electrical engineering<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/id.loc.gov\/vocabulary\/countries\/ja<\/a>>\u00A0\u00A0\u00A0\u00A0a schema:Place<\/a> ;\u00A0\u00A0\u00A0dcterms:identifier<\/a> \"ja<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/id.worldcat.org\/fast\/1728596<\/a>> # Electrical engineering<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Intangible<\/a> ;\u00A0\u00A0\u00A0schema:name<\/a> \"Electrical engineering<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/viaf.org\/viaf\/123926298<\/a>> # Institute of Electrical and Electronics Engineers.<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Organization<\/a> ;\u00A0\u00A0\u00A0schema:name<\/a> \"Institute of Electrical and Electronics Engineers.<\/span>\" ;\u00A0\u00A0\u00A0schema:name<\/a> \"Institute of Electrical and Electronics Engineers<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/viaf.org\/viaf\/312145858148423022412<\/a>> # Nichigai Asoshi\u0113tsu.<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Organization<\/a> ;\u00A0\u00A0\u00A0schema:name<\/a> \"Nichigai Asoshi\u0113tsu.<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/www.worldcat.org\/title\/-\/oclc\/1105266<\/a>>\u00A0\u00A0\u00A0\u00A0a genont:InformationResource<\/a>, genont:ContentTypeGenericResource<\/a> ;\u00A0\u00A0\u00A0schema:about<\/a> <http:\/\/www.worldcat.org\/oclc\/1105266<\/a>> ; # Cumulative index to proceedings of the IEEE. Subject and author, 1960-1971.<\/span>\u00A0\u00A0\u00A0schema:dateModified<\/a> \"2018-11-12<\/span>\" ;\u00A0\u00A0\u00A0void:inDataset<\/a> <http:\/\/purl.oclc.org\/dataset\/WorldCat<\/a>> ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/www.worldcat.org\/title\/-\/oclc\/1105266#PublicationEvent\/tokyonichigai_associates_in_association_with_institute_of_electrical_and_electronics_engineers_1973<\/a>>\u00A0\u00A0\u00A0\u00A0a schema:PublicationEvent<\/a> ;\u00A0\u00A0\u00A0schema:location<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/19215199#Place\/tokyo<\/a>> ; # Tokyo<\/span>\u00A0\u00A0\u00A0schema:organizer<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/19215199#Agent\/nichigai_associates_in_association_with_institute_of_electrical_and_electronics_engineers<\/a>> ; # Nichigai Associates, in association with Institute of Electrical and Electronics Engineers<\/span>\u00A0\u00A0\u00A0schema:startDate<\/a> \"\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>

Content-negotiable representations<\/p>