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Curriculum for test technology : M.E.I.S. Center, University of Minnesota, Minneapolis, 1983, November 16-17, 1983

Author: IEEE Computer Society. Test Technology Committee.; IEEE Computer Society.
Publisher: Silver Spring, MD : IEEE Computer Society Press ; Los Angeles, CA : Order from IEEE Computer Society, ©1983.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: IEEE Computer Society. Test Technology Committee.; IEEE Computer Society.
ISBN: 0818605200 9780818605208 0818685204 9780818685200 0818645202 9780818645204
OCLC Number: 10488854
Notes: Proceedings of the Curriculum for Test Technology Workshop.
"[Sponsored by] the Institute of Electrical and Electronics Engineers, Inc., IEEE Computer Society."
"IEEE catalog number 83CH1978-6."
"IEEE Computer Society order number 520."
Description: vii, 173 pages : illustrations ; 28 cm
Other Titles: Test technology
Responsibility: IEEE Computer Society Test Technology Committee.

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