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Desorption mass spectrometry : are SIMS and FAB the same? : developed from a symposium ... at the Univ. of Minnesota, St. Paul, Minn., Oct. 7-10, 1984

Author: Philip A Lyon
Publisher: Washington, DC, 1985.
Series: American Chemical Society., ACS symposium series ;, 291.
Edition/Format:   Print book : Conference publication : English
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Genre/Form: Kongress
Saint Paul (Minn., 1984)
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Philip A Lyon
ISBN: 0841209421 9780841209428
OCLC Number: 643113546
Description: VIII, 248 Seiten.
Contents: Molecular Secondary Ion Mass Spectrometry ; Particle Bombardment as Viewed by Molecular Dynamics ; Role of Intermolecular Interactions in the Desorption of Molecular Ions from Surfaces ; Processes of Laser-Induced Ion Formation in Mass Spectrometry ; Angle-Resolved Secondary Ion Mass Spectrometry ; Secondary Ion Mass Spectrometer-Designed Considerations for Organic and Inorganic Analysis ; Liquid Metal Ion Sources ; Fast Atom Bombardment Mass Spectrometric Technique and Ion Guns ; Fat Atom Bombardment Secondary Ion Mass Spectrometric Surface Analysis ; Secondary Ion Mass Spectrometry: A Multidimensional Technique ; Fast Atom Bombardment Combined with Tandem Mass Spectrometry for the Study of Collisionally Induced Remote Charge Site Decompositions ; Analysis of Reactions in Aqueous Solution Using Fast Atom Bombardment Mass Spectrometry ; Applications of Fast Atom Bombardment in Bio-organic Chemistry ; Use of Secondary Ion Mass Spectrometry to Study Surface Chemistry of Adhesive Bonding Materials
Series Title: American Chemical Society., ACS symposium series ;, 291.
Responsibility: Philip A. Lyon, ed.

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