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Development of certified reference materials and methods of calibration of small-angle X-ray diffractometers for certification and standardization of articles produced by nanoindustry
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Development of certified reference materials and methods of calibration of small-angle X-ray diffractometers for certification and standardization of articles produced by nanoindustry

Author: Baturin A.S.Kuzin A.Yu.Mityukhlyaev V.B.Avilov A.S.Volkov V.V.All authors
Edition/Format: Article Article : English
Publication:Measurement Techniques, v56 n9 (2013 12 01): 992-998
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Document Type: Article
All Authors / Contributors: Baturin A.S.; Kuzin A.Yu.; Mityukhlyaev V.B.; Avilov A.S.; Volkov V.V.; D'Yakova Yu.A.; Marchenkova M.A.; Seregin A.Yu.; Sul'Yanov S.N.; Tereshchenko E.Yu.; Ermakova M.A.; Todua P.A.
ISSN:0543-1972
Language Note: English
Unique Identifier: 5509338745
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