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EEEL 1997 technical accomplishments : advancing metrology for electrotechnology to support the U.S. economy.

Author: Electronics and Electrical Engineering Laboratory (National Institute of Standards and Technology); National Institute of Standards and Technology (U.S.). Technology Administration.
Publisher: [Gaithersburg, MD] : Technology Administration, National Institute of Standards and Technology, [1997]
Series: NISTIR, 6106.
Edition/Format:   Book   Microform : National government publication : Microfiche : EnglishView all editions and formats
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Material Type: Government publication, National government publication
Document Type: Book
All Authors / Contributors: Electronics and Electrical Engineering Laboratory (National Institute of Standards and Technology); National Institute of Standards and Technology (U.S.). Technology Administration.
OCLC Number: 44060160
Notes: "December 1997."
Reproduction Notes: Microfiche. [Washington, D.C.] : Supt. of Docs., U.S. G.P.O., [1998]. 1 microfiche : negative.
Description: [x], 74, [1] pages : illustrations ; 28 cm.
Series Title: NISTIR, 6106.
Other Titles: EEEL ... technical accomplishments
Electronics and Electrical Engineering Laboratory technical accomplishments, 1997
Advancing metrology for electrotechnology to support the U.S. economy

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