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Effects of small sample sizes on the symmetry and reliability of dendrograms

Author: Richard E Strauss; Robert Douglas Bradley; Robert D Owen; Texas Tech University. Museum.
Publisher: Lubbock, TX : Museum of Texas Tech University, 2002.
Series: Occasional papers (Texas Tech University. Museum), no. 214.
Edition/Format:   Print book : EnglishView all editions and formats
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Genre/Form: Methods (Music)
Methods
Document Type: Book
All Authors / Contributors: Richard E Strauss; Robert Douglas Bradley; Robert D Owen; Texas Tech University. Museum.
OCLC Number: 49886741
Notes: "15 May 2002."
Description: 11 pages : illustrations ; 28 cm.
Series Title: Occasional papers (Texas Tech University. Museum), no. 214.
Responsibility: Richard E. Strauss, Robert D. Bradley, and Robert D. Owen.

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