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Effects of specimen preparation on the accuracy of electromagnetic property measurements of solid materials with an automatic network analyzer

Author: Edward R Long; Langley Research Center.
Publisher: Washington, D.C. : National Aeronautics and Space Administration, Scientific and Technical Information Branch ; Springfield, Va. : For sale by the National Technical Information Service, 1986.
Series: NASA technical memorandum, 87628.
Edition/Format:   Print book : National government publication : EnglishView all editions and formats
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Additional Physical Format: Online version:
Long, Edward R.
Effects of specimen preparation on the accuracy of electromagnetic property measurements of solid materials with an automatic network analyzer.
Washington, D.C. : National Aeronautics and Space Administration, Scientific and Technical Information Branch ; Springfield, Va. : For sale by the National Technical Information Service, 1986
(OCoLC)760955828
Material Type: Government publication, National government publication
Document Type: Book
All Authors / Contributors: Edward R Long; Langley Research Center.
OCLC Number: 36102324
Notes: "February 1986."
Prepared at Langley Research Center.
Description: 20 pages : illustrations ; 28 cm.
Series Title: NASA technical memorandum, 87628.
Responsibility: Edward R. Long, Jr.

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Primary Entity<\/h3>\n
<http:\/\/www.worldcat.org\/oclc\/36102324<\/a>> # Effects of specimen preparation on the accuracy of electromagnetic property measurements of solid materials with an automatic network analyzer<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Book<\/a>, schema:CreativeWork<\/a> ;\u00A0\u00A0\u00A0\nlibrary:oclcnum<\/a> \"36102324<\/span>\" ;\u00A0\u00A0\u00A0\nlibrary:placeOfPublication<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/40183058#Place\/washington_d_c<\/a>> ; # Washington, D.C.<\/span>\n\u00A0\u00A0\u00A0\nlibrary:placeOfPublication<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/40183058#Place\/springfield_va<\/a>> ; # Springfield, Va.<\/span>\n\u00A0\u00A0\u00A0\nlibrary:placeOfPublication<\/a> <http:\/\/id.loc.gov\/vocabulary\/countries\/dcu<\/a>> ;\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/id.worldcat.org\/fast\/1011882<\/a>> ; # Materials--Testing<\/span>\n\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/id.loc.gov\/authorities\/subjects\/sh85082086<\/a>> ; # Materials--Testing<\/span>\n\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/40183058#Topic\/materials_electric_properties_measurement<\/a>> ; # Materials--Electric properties--Measurement<\/span>\n\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/id.worldcat.org\/fast\/905335<\/a>> ; # Electric network analyzers<\/span>\n\u00A0\u00A0\u00A0\nschema:bookFormat<\/a> bgn:PrintBook<\/a> ;\u00A0\u00A0\u00A0\nschema:contributor<\/a> <http:\/\/viaf.org\/viaf\/127305149<\/a>> ; # Langley Research Center.<\/span>\n\u00A0\u00A0\u00A0\nschema:creator<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/40183058#Person\/long_edward_r<\/a>> ; # Edward R. Long<\/span>\n\u00A0\u00A0\u00A0\nschema:datePublished<\/a> \"1986<\/span>\" ;\u00A0\u00A0\u00A0\nschema:exampleOfWork<\/a> <http:\/\/worldcat.org\/entity\/work\/id\/40183058<\/a>> ;\u00A0\u00A0\u00A0\nschema:genre<\/a> \"National government publication<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\nschema:genre<\/a> \"Government publication<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\nschema:inLanguage<\/a> \"en<\/span>\" ;\u00A0\u00A0\u00A0\nschema:isPartOf<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/40183058#Series\/nasa_technical_memorandum<\/a>> ; # NASA technical memorandum ;<\/span>\n\u00A0\u00A0\u00A0\nschema:isSimilarTo<\/a> <http:\/\/www.worldcat.org\/oclc\/760955828<\/a>> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Effects of specimen preparation on the accuracy of electromagnetic property measurements of solid materials with an automatic network analyzer<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\nschema:productID<\/a> \"36102324<\/span>\" ;\u00A0\u00A0\u00A0\nschema:publication<\/a> <http:\/\/www.worldcat.org\/title\/-\/oclc\/36102324#PublicationEvent\/washington_d_c_national_aeronautics_and_space_administration_scientific_and_technical_information_branch_springfield_va_for_sale_by_the_national_technical_information_service_1986<\/a>> ;\u00A0\u00A0\u00A0\nschema:publisher<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/40183058#Agent\/national_aeronautics_and_space_administration_scientific_and_technical_information_branch<\/a>> ; # National Aeronautics and Space Administration, Scientific and Technical Information Branch<\/span>\n\u00A0\u00A0\u00A0\nschema:publisher<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/40183058#Agent\/for_sale_by_the_national_technical_information_service<\/a>> ; # For sale by the National Technical Information Service<\/span>\n\u00A0\u00A0\u00A0\nwdrs:describedby<\/a> <http:\/\/www.worldcat.org\/title\/-\/oclc\/36102324<\/a>> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n\n

Related Entities<\/h3>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/40183058#Agent\/for_sale_by_the_national_technical_information_service<\/a>> # For sale by the National Technical Information Service<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nbgn:Agent<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"For sale by the National Technical Information Service<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/40183058#Agent\/national_aeronautics_and_space_administration_scientific_and_technical_information_branch<\/a>> # National Aeronautics and Space Administration, Scientific and Technical Information Branch<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nbgn:Agent<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"National Aeronautics and Space Administration, Scientific and Technical Information Branch<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/40183058#Person\/long_edward_r<\/a>> # Edward R. Long<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Person<\/a> ;\u00A0\u00A0\u00A0\nschema:familyName<\/a> \"Long<\/span>\" ;\u00A0\u00A0\u00A0\nschema:givenName<\/a> \"Edward R.<\/span>\" ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Edward R. Long<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/40183058#Place\/springfield_va<\/a>> # Springfield, Va.<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Place<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Springfield, Va.<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/40183058#Place\/washington_d_c<\/a>> # Washington, D.C.<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Place<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Washington, D.C.<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/40183058#Series\/nasa_technical_memorandum<\/a>> # NASA technical memorandum ;<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nbgn:PublicationSeries<\/a> ;\u00A0\u00A0\u00A0\nschema:hasPart<\/a> <http:\/\/www.worldcat.org\/oclc\/36102324<\/a>> ; # Effects of specimen preparation on the accuracy of electromagnetic property measurements of solid materials with an automatic network analyzer<\/span>\n\u00A0\u00A0\u00A0\nschema:name<\/a> \"NASA technical memorandum ;<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/40183058#Topic\/materials_electric_properties_measurement<\/a>> # Materials--Electric properties--Measurement<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\nschema:hasPart<\/a> <http:\/\/id.loc.gov\/authorities\/subjects\/sh85082075<\/a>> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Materials--Electric properties--Measurement<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/id.loc.gov\/authorities\/subjects\/sh85082086<\/a>> # Materials--Testing<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Materials--Testing<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/id.loc.gov\/vocabulary\/countries\/dcu<\/a>>\u00A0\u00A0\u00A0\u00A0a \nschema:Place<\/a> ;\u00A0\u00A0\u00A0\ndcterms:identifier<\/a> \"dcu<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/id.worldcat.org\/fast\/1011882<\/a>> # Materials--Testing<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Materials--Testing<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/id.worldcat.org\/fast\/905335<\/a>> # Electric network analyzers<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Electric network analyzers<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/viaf.org\/viaf\/127305149<\/a>> # Langley Research Center.<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Organization<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Langley Research Center.<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/www.worldcat.org\/oclc\/760955828<\/a>>\u00A0\u00A0\u00A0\u00A0a \nschema:CreativeWork<\/a> ;\u00A0\u00A0\u00A0\nrdfs:label<\/a> \"Effects of specimen preparation on the accuracy of electromagnetic property measurements of solid materials with an automatic network analyzer.<\/span>\" ;\u00A0\u00A0\u00A0\nschema:description<\/a> \"Online version:<\/span>\" ;\u00A0\u00A0\u00A0\nschema:isSimilarTo<\/a> <http:\/\/www.worldcat.org\/oclc\/36102324<\/a>> ; # Effects of specimen preparation on the accuracy of electromagnetic property measurements of solid materials with an automatic network analyzer<\/span>\n\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/www.worldcat.org\/title\/-\/oclc\/36102324<\/a>>\u00A0\u00A0\u00A0\u00A0a \ngenont:InformationResource<\/a>, genont:ContentTypeGenericResource<\/a> ;\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/www.worldcat.org\/oclc\/36102324<\/a>> ; # Effects of specimen preparation on the accuracy of electromagnetic property measurements of solid materials with an automatic network analyzer<\/span>\n\u00A0\u00A0\u00A0\nschema:dateModified<\/a> \"2019-07-21<\/span>\" ;\u00A0\u00A0\u00A0\nvoid:inDataset<\/a> <http:\/\/purl.oclc.org\/dataset\/WorldCat<\/a>> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/www.worldcat.org\/title\/-\/oclc\/36102324#PublicationEvent\/washington_d_c_national_aeronautics_and_space_administration_scientific_and_technical_information_branch_springfield_va_for_sale_by_the_national_technical_information_service_1986<\/a>>\u00A0\u00A0\u00A0\u00A0a \nschema:PublicationEvent<\/a> ;\u00A0\u00A0\u00A0\nschema:location<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/40183058#Place\/springfield_va<\/a>> ; # Springfield, Va.<\/span>\n\u00A0\u00A0\u00A0\nschema:location<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/40183058#Place\/washington_d_c<\/a>> ; # Washington, D.C.<\/span>\n\u00A0\u00A0\u00A0\nschema:organizer<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/40183058#Agent\/for_sale_by_the_national_technical_information_service<\/a>> ; # For sale by the National Technical Information Service<\/span>\n\u00A0\u00A0\u00A0\nschema:organizer<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/40183058#Agent\/national_aeronautics_and_space_administration_scientific_and_technical_information_branch<\/a>> ; # National Aeronautics and Space Administration, Scientific and Technical Information Branch<\/span>\n\u00A0\u00A0\u00A0\nschema:startDate<\/a> \"1986<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n\n

Content-negotiable representations<\/p>\n