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EXAFS Spectroscopy : Techniques and Applications

Author: B K Teo; David C Joy
Publisher: Boston, MA : Springer US, 1981.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
This book on Extended X-Ray Absorption Fine Structure (EXAFS) Spectroscopy grew out of a symposium, with the same title, organized by us at the 1979 Meeting of the Materials Research Society (MRS) in Boston, MA. That meeting provided not only an overview of the theory, instrumentation and practice of EXAFS Spectroscopy as currently employed with photon beams, but also a forum for a valuable dialogue between those  Read more...
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Genre/Form: Electronic books
Additional Physical Format: Print version:
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: B K Teo; David C Joy
ISBN: 9781475712384 1475712383
OCLC Number: 853258279
Language Note: English.
Description: 1 online resource (viii, 275 pages)
Contents: 1 Historical Development of EXAFS --
2 Theory of Extended X-Ray Absorption Fine Structure --
3 EXAFS Spectroscopy: Techniques and Applications --
4 Understanding the Causes of Non-Transferability of EXAFS Amplitude --
5 Near Neighbor Peak Shape Considerations in EXAFS Analysis --
6 Disorder Effects in the EXAFS of Metals and Semiconductors in the Solid and Liquid States --
7 Structural Studies of Supertonic Conduction --
8 Extended X-Ray Absorption Fine Structure Studies at High Pressure --
9 Structural Evidence for Solutions from EXAFS Measurements --
10 EXAFS Studies of Supported Metal Catalysts --
11 EXAFS of Amorphous Materials --
12 EXAFS of Dilute Systems: Fluorescence Detection --
13 EXAFS Studies of Dilute Impurities in Solids --
14 Materials Research at Stanford Synchrotron Radiation Laboratory --
15 Cornell High Energy Synchrotron Source: CHESS --
16 National Synchrotron Light Source (NSLS): An Optimized Source for Synchrotron Radiation --
17 Electron Energy Loss Spectroscopy for Extended Fine Structure Studies --
An Introduction --
18 Extended Core Edge Fine Structure in Electron Energy Loss Spectra --
19 Extended Energy Loss Fine Structure Studies in an Electron Microscope --
20 A Comparison of Electron and Photon Beams for Obtaining Inner Shell Spectra --
21 Some Thoughts Concerning the Radiation Damage Resulting from Measurement of Inner Shell Excitation Spectra Using Electron and Photon Beams.
Responsibility: edited by B.K. Teo, D.C. Joy.

Abstract:

This book on Extended X-Ray Absorption Fine Structure (EXAFS) Spectroscopy grew out of a symposium, with the same title, organized by us at the 1979 Meeting of the Materials Research Society (MRS) in  Read more...

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