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Examining the role of patent quality in large-scale "patent war" litigation : a historical comparison and proposal for a restorative U.S. patent system

Author: Wael Zohni
Publisher: Baden-Baden, Germany : Nomos, 2018. ©2018
Series: MIPLC studies, v.31.
Edition/Format:   Print book : English : 1st editionView all editions and formats
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Document Type: Book
All Authors / Contributors: Wael Zohni
ISBN: 3848751070 9783848751075
OCLC Number: 1053864903
Notes: Originally presented as the author's thesis (doctoral)--Munich Intellectual Property Law Center, 2017.
Description: 78 pages : illustrations ; 23 cm.
Series Title: MIPLC studies, v.31.
Responsibility: Wael Zohni.

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