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Exploring scanning probe microscopy with MATHEMATICA

Author: Dror Sarid
Publisher: [Weinheim] Wiley-VCH [Weinheim] Wiley-VCH 2008
Edition/Format:   eBook : Document : English : 2., completely rev. and enl. edView all editions and formats
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This new and updated edition features a new applications section, reflecting the many breakthroughs in the field over the last years. It provides a set of computational models that describe the  Read more...

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Genre/Form: Electronic books
Online-Publikation
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Dror Sarid
ISBN: 9783527406173 3527610065 9783527610068 3527406174 9783527406173
OCLC Number: 836815591
Description: Online-Ressource (Text)
Contents: 1 Introduction. 2 Uniform Cantilevers. 3 Cantilever Conversion Tables. 4 V-Shaped Cantilevers. 5 Tip Sample Adhesion. 6 Tip Sample Force Curve. 7 Free Vibrations. 8 Noncontact Mode. 9 Tapping Mode. 10 Metal-Insulator-Metal Tunneling. 11 Fowler-Nordheim Tunneling. 12 Scanning Tunneling Spectroscopy. 13 Coulomb Blockade. 14 Density of States. 15 Electrostatics. 16 Near-Field Optics. 17 Constriction and Boundary Resistence. 18 Scanning Thermal Conductivity Microscopy. 19 Kelvin Probe Force Microscopy. 20 Raman Scattering in Nanocrystals.
Responsibility: Author(s): Dror Sarid

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