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Fault tolerant architectures for cryptography and hardware security

Author: Sikhar Patranabis; Debdeep Mukhopadhyay
Publisher: Singapore : Springer, [2018]
Series: Computer architecture and design methodologies.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
This book uses motivating examples and real-life attack scenarios to introduce readers to the general concept of fault attacks in cryptography. It offers insights into how the fault tolerance theories developed in the book can actually be implemented, with a particular focus on a wide spectrum of fault models and practical fault injection techniques, ranging from simple, low-cost techniques to high-end  Read more...
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Genre/Form: Electronic books
Additional Physical Format: Printed edition:
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Sikhar Patranabis; Debdeep Mukhopadhyay
ISBN: 9789811013874 981101387X
OCLC Number: 1030303391
Description: 1 online resource (xii, 240 pages)
Contents: Intro; Preface; Acknowledgements; Contents; Part I Fault Attacks: A Preamble; 1 Introduction to Fault Attacks; 1.1 Introduction; 1.2 Fault Attacks and Fault Models; 1.2.1 Differential Fault Analysis (DFA); 1.2.2 Fault Sensitivity Analysis; 1.2.3 Differential Fault Intensity Analysis (DFIA); 1.2.4 Safe-Error Attacks (SEA) and Differential Behavior Analysis (DBA); 1.3 Fault Injection Techniques: Semi-invasive and Non-invasive Methodologies; 1.3.1 Spike Attacks; 1.3.2 Glitch Attacks; 1.3.3 Optical/Laser Attacks; 1.3.4 Electromagnetic Attacks; 1.4 Organization of the Book. 2 Classical Fault Attacks on Public and Symmetric-Key Cryptosystems2.1 The Seminal Fault Attack on RSA; 2.2 Differential Fault Analysis of Block Ciphers; 2.2.1 The Basic Principle of DFA; 2.2.2 Permanent and Transient Faults; 2.2.3 Fault Models for DFA; 2.2.4 DFA on a Generic SPN Block Cipher; 2.2.5 Case Study: Differential Fault Analysis of the Advanced Encryption Standard; 2.2.6 DFA of AES-128 Using Multiple Byte Faults; 2.2.7 DFA of the AES-128 Key Schedule; 2.2.8 DFA of AES-192 and AES-256; 2.3 Differential Fault Analysis of Stream Ciphers; 2.3.1 A Brief Description of Grain-128. 2.3.2 The DFA Attack Model2.3.3 Signature Generation; 2.3.4 Fault Location Determination; 2.3.5 Recovering the Internal State of the Cipher; 2.3.6 Experimental Results: Faults Generated in Hardware; 2.3.7 Probability of Identifying a Random Fault Location; 2.4 Summary; Part II Side-Channel Inspired and Assisted Fault Analysis Techniques; 3 Side-Channel Inspired Fault Analysis Techniques; 3.1 Fault Sensitivity Analysis of Block Ciphers; 3.1.1 General Attack Principle; 3.1.2 Formal Attack Procedure; 3.1.3 Advantages of FSA over DFA; 3.2 Differential Fault Intensity Analysis of Block Ciphers. 3.2.1 The Fault Model for DFIA3.2.2 The General Attack Methodology; 3.2.3 Advantages of DFIA; 3.2.4 Case Study: DFIA on AES-128; 3.3 Chapter Summary; 4 Side-Channel Assisted Fault Analysis; 4.1 Introduction; 4.2 Chapter Preliminaries; 4.2.1 Overview of the PRESENT Block Cipher; 4.2.2 Associated Literature; 4.3 The Combined SCA and DFA of PRESENT; 4.3.1 Properties of the PRESENT Block Cipher; 4.3.2 Fault Model and Fault Location; 4.3.3 The Role of Side-Channel Analysis in Our Attack; 4.3.4 The Fault Propagation Characteristics; 4.3.5 The Key Recovery Process; 4.4 Experimental Results. 4.4.1 The Combined SCA+FA Setup4.4.2 Determination of Fault Mask; 4.4.3 Key Recovery: Performance and Efficiency; 4.5 Discussion; 4.5.1 Extension to Other Rounds & Targets; 4.5.2 Extension to Other PRESENT-Like Block Ciphers; 4.5.3 Possible Countermeasures; 4.6 Summary; Part III Advanced Fault Analysis Techniques and Fault Analysis Automation; 5 Laser-Based Fault Injection on Microcontrollers; 5.1 Introduction; 5.2 Historical Development; 5.3 The Physics of Laser Fault Injection; 5.4 Device Decapsulation; 5.4.1 Chemical Techniques; 5.4.2 Mechanical Techniques; 5.5 Targeting a Microcontroller.
Series Title: Computer architecture and design methodologies.
Responsibility: Sikhar Patranabis, Debdeep Mukhopadhyay, editors.

Abstract:

It offers insights into how the fault tolerance theories developed in the book can actually be implemented, with a particular focus on a wide spectrum of fault models and practical fault injection  Read more...

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