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ICMTS 2018 : proceedings of the 2018 IEEE International Conference on Microelectronic Test Structures : 31st ICMTS : March 19-22, 2018, Courtyard by Marriott Austin Downtown/Convention Center, Austin, Texas, USA

Author: IEEE Electron Devices Society,
Publisher: [Piscataway, New Jersey] : IEEE, [2018?] ©2018
Edition/Format:   eBook : Document : Conference publication
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: IEEE Electron Devices Society,
OCLC Number: 1053697736
Notes: IEEE Catalog Number: CFP18MTS-PRT.
Description: 1 online resource : illustrations
Other Titles: 2018 IEEE International Conference on Microelectronic Test Structures
31st ICMTS
Proceedings of the 2018 IEEE International Conference on Microelectronic Test Structures
Microelectronic Test Structures (ICMTS), 2018 IEEE International Conference on
Responsibility: sponsored by the IEEE Electron Devices Society.

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Primary Entity

<http://www.worldcat.org/oclc/1053697736> # ICMTS 2018 : proceedings of the 2018 IEEE International Conference on Microelectronic Test Structures : 31st ICMTS : March 19-22, 2018, Courtyard by Marriott Austin Downtown/Convention Center, Austin, Texas, USA
    a schema:MediaObject, schema:CreativeWork, schema:Book ;
    library:oclcnum "1053697736" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nju> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/5379242129#Topic/electronic_apparatus_and_appliances_testing> ; # Electronic apparatus and appliances--Testing
    schema:about <http://experiment.worldcat.org/entity/work/data/5379242129#Topic/semiconductors_testing> ; # Semiconductors--Testing
    schema:about <http://experiment.worldcat.org/entity/work/data/5379242129#Topic/integrated_circuits_testing> ; # Integrated circuits--Testing
    schema:alternateName "31st ICMTS" ;
    schema:alternateName "Microelectronic Test Structures (ICMTS), 2018 IEEE International Conference on" ;
    schema:alternateName "2018 IEEE International Conference on Microelectronic Test Structures" ;
    schema:alternateName "Proceedings of the 2018 IEEE International Conference on Microelectronic Test Structures" ;
    schema:bookFormat schema:EBook ;
    schema:contributor <http://experiment.worldcat.org/entity/work/data/5379242129#Organization/ieee_electron_devices_society> ; # IEEE Electron Devices Society,
    schema:copyrightYear "2018" ;
    schema:creator <http://experiment.worldcat.org/entity/work/data/5379242129#Meeting/ieee_international_conference_on_microelectronic_test_structures_31st_2018_austin_tex> ; # IEEE International Conference on Microelectronic Test Structures (31st : 2018 : Austin, Tex.)
    schema:datePublished "2018" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/5379242129> ;
    schema:genre "Conference papers and proceedings" ;
    schema:genre "Conference publication"@en ;
    schema:name "ICMTS 2018 : proceedings of the 2018 IEEE International Conference on Microelectronic Test Structures : 31st ICMTS : March 19-22, 2018, Courtyard by Marriott Austin Downtown/Convention Center, Austin, Texas, USA" ;
    schema:productID "1053697736" ;
    schema:url <https://ieeexplore.ieee.org/servlet/opac?punumber=8375243> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/1053697736> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/5379242129#Meeting/ieee_international_conference_on_microelectronic_test_structures_31st_2018_austin_tex> # IEEE International Conference on Microelectronic Test Structures (31st : 2018 : Austin, Tex.)
    a bgn:Meeting, schema:Event ;
    schema:location <http://experiment.worldcat.org/entity/work/data/5379242129#Place/austin_tex> ; # Austin, Tex.)
    schema:name "IEEE International Conference on Microelectronic Test Structures (31st : 2018 : Austin, Tex.)" ;
    .

<http://experiment.worldcat.org/entity/work/data/5379242129#Organization/ieee_electron_devices_society> # IEEE Electron Devices Society,
    a schema:Organization ;
    schema:name "IEEE Electron Devices Society," ;
    .

<http://experiment.worldcat.org/entity/work/data/5379242129#Place/austin_tex> # Austin, Tex.)
    a schema:Place ;
    schema:name "Austin, Tex.)" ;
    .

<http://experiment.worldcat.org/entity/work/data/5379242129#Topic/electronic_apparatus_and_appliances_testing> # Electronic apparatus and appliances--Testing
    a schema:Intangible ;
    schema:name "Electronic apparatus and appliances--Testing" ;
    .

<http://experiment.worldcat.org/entity/work/data/5379242129#Topic/integrated_circuits_testing> # Integrated circuits--Testing
    a schema:Intangible ;
    schema:name "Integrated circuits--Testing" ;
    .

<http://experiment.worldcat.org/entity/work/data/5379242129#Topic/semiconductors_testing> # Semiconductors--Testing
    a schema:Intangible ;
    schema:name "Semiconductors--Testing" ;
    .

<http://www.worldcat.org/title/-/oclc/1053697736>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
    schema:about <http://www.worldcat.org/oclc/1053697736> ; # ICMTS 2018 : proceedings of the 2018 IEEE International Conference on Microelectronic Test Structures : 31st ICMTS : March 19-22, 2018, Courtyard by Marriott Austin Downtown/Convention Center, Austin, Texas, USA
    schema:dateModified "2019-05-09" ;
    void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


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