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IEEE standard C/ATLAS test language : Common ATLAS, a subset of the ATLAS test language Preview this item
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IEEE standard C/ATLAS test language : Common ATLAS, a subset of the ATLAS test language

Author: IEEE ATLAS Committee.
Publisher: New York : Institute of Electrical and Electronics Engineers : Distributed in cooperation with Wiley-Interscience, ©1985.
Edition/Format:   Print book : EnglishView all editions and formats
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Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: IEEE ATLAS Committee.
ISBN: 0471011339 9780471011330
OCLC Number: 12895185
Notes: "ANSI/IEEE Std 716-1985 (Editorial Revision of ANSI/IEEE Std 716- and 717-1982."
Description: 1 volume (various pagings) : illustrations ; 27 cm
Other Titles: ANSI/IEEE Std 716-1985.
Responsibility: sponsor, IEEE SCC 20 Committee of the IEEE Standards Board.

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Primary Entity<\/h3>\n
<http:\/\/www.worldcat.org\/oclc\/12895185<\/a>> # IEEE standard C\/ATLAS test language : Common ATLAS, a subset of the ATLAS test language<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Book<\/a>, schema:CreativeWork<\/a> ;\u00A0\u00A0\u00A0\nlibrary:oclcnum<\/a> \"12895185<\/span>\" ;\u00A0\u00A0\u00A0\nlibrary:placeOfPublication<\/a> <http:\/\/id.loc.gov\/vocabulary\/countries\/nyu<\/a>> ;\u00A0\u00A0\u00A0\nlibrary:placeOfPublication<\/a> <http:\/\/dbpedia.org\/resource\/New_York_City<\/a>> ; # New York<\/span>\n\u00A0\u00A0\u00A0\nrdfs:seeAlso<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/54766386#CreativeWork\/ansi_ieee_std_716_1985<\/a>> ; # ANSI\/IEEE Std 716-1985.<\/span>\n\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/54766386#Topic\/electronic_apparatus_and_appliances_testing_data_processing<\/a>> ; # Electronic apparatus and appliances--Testing--Data processing<\/span>\n\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/id.worldcat.org\/fast\/1204155<\/a>> ; # United States.<\/span>\n\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/54766386#Topic\/tests<\/a>> ; # TESTS<\/span>\n\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/54766386#Topic\/checkout<\/a>> ; # CHECKOUT<\/span>\n\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/54766386#Topic\/programming_languages<\/a>> ; # PROGRAMMING LANGUAGES<\/span>\n\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/54766386#Topic\/standards<\/a>> ; # STANDARDS<\/span>\n\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/id.worldcat.org\/fast\/794111<\/a>> ; # ATLAS (Computer program language)--Standards<\/span>\n\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/54766386#Topic\/atlas_computer_program_language_standards_united_states<\/a>> ; # ATLAS (Computer program language)--Standards--United States<\/span>\n\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/id.worldcat.org\/fast\/906840<\/a>> ; # Electronic apparatus and appliances--Testing--Data processing<\/span>\n\u00A0\u00A0\u00A0\nschema:bookFormat<\/a> bgn:PrintBook<\/a> ;\u00A0\u00A0\u00A0\nschema:contributor<\/a> <http:\/\/viaf.org\/viaf\/155941635<\/a>> ; # IEEE ATLAS Committee.<\/span>\n\u00A0\u00A0\u00A0\nschema:copyrightYear<\/a> \"1985<\/span>\" ;\u00A0\u00A0\u00A0\nschema:datePublished<\/a> \"1985<\/span>\" ;\u00A0\u00A0\u00A0\nschema:exampleOfWork<\/a> <http:\/\/worldcat.org\/entity\/work\/id\/54766386<\/a>> ;\u00A0\u00A0\u00A0\nschema:inLanguage<\/a> \"en<\/span>\" ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"IEEE standard C\/ATLAS test language : Common ATLAS, a subset of the ATLAS test language<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\nschema:productID<\/a> \"12895185<\/span>\" ;\u00A0\u00A0\u00A0\nschema:publication<\/a> <http:\/\/www.worldcat.org\/title\/-\/oclc\/12895185#PublicationEvent\/new_york_institute_of_electrical_and_electronics_engineers_distributed_in_cooperation_with_wiley_interscience_1985<\/a>> ;\u00A0\u00A0\u00A0\nschema:publisher<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/54766386#Agent\/distributed_in_cooperation_with_wiley_interscience<\/a>> ; # Distributed in cooperation with Wiley-Interscience<\/span>\n\u00A0\u00A0\u00A0\nschema:publisher<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/54766386#Agent\/institute_of_electrical_and_electronics_engineers<\/a>> ; # Institute of Electrical and Electronics Engineers<\/span>\n\u00A0\u00A0\u00A0\nschema:url<\/a> <http:\/\/ieeexplore.ieee.org\/servlet\/opac?punumber=2380<\/a>> ;\u00A0\u00A0\u00A0\nschema:workExample<\/a> <http:\/\/worldcat.org\/isbn\/9780471011330<\/a>> ;\u00A0\u00A0\u00A0\nwdrs:describedby<\/a> <http:\/\/www.worldcat.org\/title\/-\/oclc\/12895185<\/a>> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n\n

Related Entities<\/h3>\n
<http:\/\/dbpedia.org\/resource\/New_York_City<\/a>> # New York<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Place<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"New York<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/54766386#Agent\/distributed_in_cooperation_with_wiley_interscience<\/a>> # Distributed in cooperation with Wiley-Interscience<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nbgn:Agent<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Distributed in cooperation with Wiley-Interscience<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/54766386#Agent\/institute_of_electrical_and_electronics_engineers<\/a>> # Institute of Electrical and Electronics Engineers<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nbgn:Agent<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Institute of Electrical and Electronics Engineers<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/54766386#CreativeWork\/ansi_ieee_std_716_1985<\/a>> # ANSI\/IEEE Std 716-1985.<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:CreativeWork<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"ANSI\/IEEE Std 716-1985.<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/54766386#Topic\/atlas_computer_program_language_standards_united_states<\/a>> # ATLAS (Computer program language)--Standards--United States<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\nschema:hasPart<\/a> <http:\/\/id.loc.gov\/authorities\/subjects\/sh85009224<\/a>> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"ATLAS (Computer program language)--Standards--United States<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/54766386#Topic\/checkout<\/a>> # CHECKOUT<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"CHECKOUT<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/54766386#Topic\/electronic_apparatus_and_appliances_testing_data_processing<\/a>> # Electronic apparatus and appliances--Testing--Data processing<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\nschema:hasPart<\/a> <http:\/\/id.loc.gov\/authorities\/subjects\/sh85042269<\/a>> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Electronic apparatus and appliances--Testing--Data processing<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/54766386#Topic\/programming_languages<\/a>> # PROGRAMMING LANGUAGES<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"PROGRAMMING LANGUAGES<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/54766386#Topic\/standards<\/a>> # STANDARDS<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"STANDARDS<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/54766386#Topic\/tests<\/a>> # TESTS<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"TESTS<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/id.loc.gov\/vocabulary\/countries\/nyu<\/a>>\u00A0\u00A0\u00A0\u00A0a \nschema:Place<\/a> ;\u00A0\u00A0\u00A0\ndcterms:identifier<\/a> \"nyu<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/id.worldcat.org\/fast\/1204155<\/a>> # United States.<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Place<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"United States.<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/id.worldcat.org\/fast\/794111<\/a>> # ATLAS (Computer program language)--Standards<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"ATLAS (Computer program language)--Standards<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/id.worldcat.org\/fast\/906840<\/a>> # Electronic apparatus and appliances--Testing--Data processing<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Electronic apparatus and appliances--Testing--Data processing<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/viaf.org\/viaf\/155941635<\/a>> # IEEE ATLAS Committee.<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Organization<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"IEEE ATLAS Committee.<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/worldcat.org\/isbn\/9780471011330<\/a>>\u00A0\u00A0\u00A0\u00A0a \nschema:ProductModel<\/a> ;\u00A0\u00A0\u00A0\nschema:isbn<\/a> \"0471011339<\/span>\" ;\u00A0\u00A0\u00A0\nschema:isbn<\/a> \"9780471011330<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/www.worldcat.org\/title\/-\/oclc\/12895185<\/a>>\u00A0\u00A0\u00A0\u00A0a \ngenont:InformationResource<\/a>, genont:ContentTypeGenericResource<\/a> ;\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/www.worldcat.org\/oclc\/12895185<\/a>> ; # IEEE standard C\/ATLAS test language : Common ATLAS, a subset of the ATLAS test language<\/span>\n\u00A0\u00A0\u00A0\nschema:dateModified<\/a> \"2019-07-30<\/span>\" ;\u00A0\u00A0\u00A0\nvoid:inDataset<\/a> <http:\/\/purl.oclc.org\/dataset\/WorldCat<\/a>> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/www.worldcat.org\/title\/-\/oclc\/12895185#PublicationEvent\/new_york_institute_of_electrical_and_electronics_engineers_distributed_in_cooperation_with_wiley_interscience_1985<\/a>>\u00A0\u00A0\u00A0\u00A0a \nschema:PublicationEvent<\/a> ;\u00A0\u00A0\u00A0\nschema:location<\/a> <http:\/\/dbpedia.org\/resource\/New_York_City<\/a>> ; # New York<\/span>\n\u00A0\u00A0\u00A0\nschema:organizer<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/54766386#Agent\/distributed_in_cooperation_with_wiley_interscience<\/a>> ; # Distributed in cooperation with Wiley-Interscience<\/span>\n\u00A0\u00A0\u00A0\nschema:organizer<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/54766386#Agent\/institute_of_electrical_and_electronics_engineers<\/a>> ; # Institute of Electrical and Electronics Engineers<\/span>\n\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n\n

Content-negotiable representations<\/p>\n