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IEEE transactions on device and materials reliability : a publication of the IEEE Electron Devices Society and the IEEE Reliability Society.

Author: IEEE Electron Devices Society.; IEEE Reliability Society.; Institute of Electrical and Electronics Engineers.
Publisher: New York, NY : Institute of Electrical and Electronics Engineers, ©2001-
Edition/Format:   eJournal/eMagazine : Periodical : EnglishView all editions and formats
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Genre/Form: Periodicals
Material Type: Periodical, Internet resource
Document Type: Internet Resource, Computer File, Journal / Magazine / Newspaper
All Authors / Contributors: IEEE Electron Devices Society.; IEEE Reliability Society.; Institute of Electrical and Electronics Engineers.
ISSN:1530-4388
OCLC Number: 1084446055
Other Titles: IEEE transactions on device and materials reliability
T-DMR
Institute of Electrical and Electronics Engineers transactions on device and material reliability
Device and materials reliability

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