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IEEE transactions on reliability

Publisher: Los Alamitos, CA : IEEE Computer Society, 1994-
Edition/Format:   eJournal/eMagazine : EnglishView all editions and formats
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Genre/Form: Revistes electròniques
Material Type: Internet resource
Document Type: Internet Resource, Journal / Magazine / Newspaper
ISSN:0018-9529
OCLC Number: 865227215
Notes: Variant del títol: Reliability.
Descripció basada en: 2001.
Other Titles: Institute of Electrical and Electronic Engineers transactions on reliability
Reliability, IEEE Transactions on
Transactions on reliability, IEEE
IEEE Xplore.

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Primary Entity<\/h3>\n
<http:\/\/www.worldcat.org\/oclc\/865227215<\/a>> # IEEE transactions on reliability<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:MediaObject<\/a>, schema:Periodical<\/a>, schema:CreativeWork<\/a> ;\u00A0\u00A0\u00A0\nlibrary:oclcnum<\/a> \"865227215<\/span>\" ;\u00A0\u00A0\u00A0\nlibrary:placeOfPublication<\/a> <http:\/\/id.loc.gov\/vocabulary\/countries\/cau<\/a>> ;\u00A0\u00A0\u00A0\nlibrary:placeOfPublication<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/375916838#Place\/los_alamitos_ca<\/a>> ; # Los Alamitos, CA<\/span>\n\u00A0\u00A0\u00A0\nrdfs:seeAlso<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/375916838#CreativeWork\/ieee_xplore<\/a>> ; # IEEE Xplore.<\/span>\n\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/375916838#Topic\/electronica_revistes<\/a>> ; # Electr\u00F2nica--Revistes<\/span>\n\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/375916838#Topic\/electronica_aparells_i_instruments_fiabilitat_revistes<\/a>> ; # Electr\u00F2nica--Aparells i instruments--Fiabilitat--Revistes<\/span>\n\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/375916838#Topic\/fiabilitat_revistes<\/a>> ; # Fiabilitat--Revistes<\/span>\n\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/375916838#Topic\/fiabilitat_enginyeria_revistes<\/a>> ; # Fiabilitat (Enginyeria)--Revistes<\/span>\n\u00A0\u00A0\u00A0\nschema:alternateName<\/a> \"Transactions on reliability, IEEE<\/span>\" ;\u00A0\u00A0\u00A0\nschema:alternateName<\/a> \"Institute of Electrical and Electronic Engineers transactions on reliability<\/span>\" ;\u00A0\u00A0\u00A0\nschema:alternateName<\/a> \"Reliability, IEEE Transactions on<\/span>\" ;\u00A0\u00A0\u00A0\nschema:datePublished<\/a> \"1994\/<\/span>\" ;\u00A0\u00A0\u00A0\nschema:datePublished<\/a> \"1994\/9999<\/span>\" ;\u00A0\u00A0\u00A0\nschema:exampleOfWork<\/a> <http:\/\/worldcat.org\/entity\/work\/id\/375916838<\/a>> ;\u00A0\u00A0\u00A0\nschema:genre<\/a> \"Revistes electr\u00F2niques<\/span>\" ;\u00A0\u00A0\u00A0\nschema:inLanguage<\/a> \"en<\/span>\" ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"IEEE transactions on reliability<\/span>\" ;\u00A0\u00A0\u00A0\nschema:productID<\/a> \"865227215<\/span>\" ;\u00A0\u00A0\u00A0\nschema:publication<\/a> <http:\/\/www.worldcat.org\/title\/-\/oclc\/865227215#PublicationEvent\/los_alamitos_ca_ieee_computer_society_1994<\/a>> ;\u00A0\u00A0\u00A0\nschema:publisher<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/375916838#Agent\/ieee_computer_society<\/a>> ; # IEEE Computer Society<\/span>\n\u00A0\u00A0\u00A0\nschema:url<\/a> <http:\/\/sfx.urv.cat\/urv?url_ver=Z39.88-2004&rft.issn=0018-9529&sfx.ignore_date_threshold=1&rfr_id=info:sid\/sfxit.com:curv<\/a>> ;\u00A0\u00A0\u00A0\nschema:workExample<\/a> <http:\/\/worldcat.org\/issn\/0018-9529<\/a>> ; # IEEE transactions on reliability<\/span>\n\u00A0\u00A0\u00A0\nwdrs:describedby<\/a> <http:\/\/www.worldcat.org\/title\/-\/oclc\/865227215<\/a>> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n\n

Related Entities<\/h3>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/375916838#Agent\/ieee_computer_society<\/a>> # IEEE Computer Society<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nbgn:Agent<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"IEEE Computer Society<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/375916838#CreativeWork\/ieee_xplore<\/a>> # IEEE Xplore.<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:CreativeWork<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"IEEE Xplore.<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/375916838#Place\/los_alamitos_ca<\/a>> # Los Alamitos, CA<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Place<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Los Alamitos, CA<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/375916838#Topic\/electronica_aparells_i_instruments_fiabilitat_revistes<\/a>> # Electr\u00F2nica--Aparells i instruments--Fiabilitat--Revistes<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Electr\u00F2nica--Aparells i instruments--Fiabilitat--Revistes<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/375916838#Topic\/electronica_revistes<\/a>> # Electr\u00F2nica--Revistes<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Electr\u00F2nica--Revistes<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/375916838#Topic\/fiabilitat_enginyeria_revistes<\/a>> # Fiabilitat (Enginyeria)--Revistes<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Fiabilitat (Enginyeria)--Revistes<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/375916838#Topic\/fiabilitat_revistes<\/a>> # Fiabilitat--Revistes<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Fiabilitat--Revistes<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/id.loc.gov\/vocabulary\/countries\/cau<\/a>>\u00A0\u00A0\u00A0\u00A0a \nschema:Place<\/a> ;\u00A0\u00A0\u00A0\ndcterms:identifier<\/a> \"cau<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/sfx.urv.cat\/urv?url_ver=Z39.88-2004&rft.issn=0018-9529&sfx.ignore_date_threshold=1&rfr_id=info:sid\/sfxit.com:curv<\/a>>\u00A0\u00A0\u00A0\nrdfs:comment<\/a> \"Acc\u00E9s restringit als usuaris de la UB, UAB, UPC, UdG, UdL, URV, UPF i BC<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/worldcat.org\/entity\/work\/id\/375916838<\/a>>\u00A0\u00A0\u00A0\numbel:isLike<\/a> <http:\/\/worldcat.org\/issn\/0018-9529<\/a>> ; # IEEE transactions on reliability<\/span>\n\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/worldcat.org\/issn\/0018-9529<\/a>> # IEEE transactions on reliability<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Periodical<\/a> ;\u00A0\u00A0\u00A0\nschema:issn<\/a> \"0018-9529<\/span>\" ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"IEEE transactions on reliability<\/span>\" ;\u00A0\u00A0\u00A0\numbel:isLike<\/a> <http:\/\/worldcat.org\/entity\/work\/id\/375916838<\/a>> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/www.worldcat.org\/title\/-\/oclc\/865227215<\/a>>\u00A0\u00A0\u00A0\u00A0a \ngenont:InformationResource<\/a>, genont:ContentTypeGenericResource<\/a> ;\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/www.worldcat.org\/oclc\/865227215<\/a>> ; # IEEE transactions on reliability<\/span>\n\u00A0\u00A0\u00A0\nschema:dateModified<\/a> \"2019-02-09<\/span>\" ;\u00A0\u00A0\u00A0\nvoid:inDataset<\/a> <http:\/\/purl.oclc.org\/dataset\/WorldCat<\/a>> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/www.worldcat.org\/title\/-\/oclc\/865227215#PublicationEvent\/los_alamitos_ca_ieee_computer_society_1994<\/a>>\u00A0\u00A0\u00A0\u00A0a \nschema:PublicationEvent<\/a> ;\u00A0\u00A0\u00A0\nschema:location<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/375916838#Place\/los_alamitos_ca<\/a>> ; # Los Alamitos, CA<\/span>\n\u00A0\u00A0\u00A0\nschema:organizer<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/375916838#Agent\/ieee_computer_society<\/a>> ; # IEEE Computer Society<\/span>\n\u00A0\u00A0\u00A0\nschema:startDate<\/a> \"1994-<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n\n

Content-negotiable representations<\/p>\n