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Introduction to Quantum Metrology : The Revised SI System and Quantum Standards

Author: Waldemar Nawrocki
Publisher: Cham : Springer, [2019]
Edition/Format:   eBook : Document : English : Second editionView all editions and formats
Summary:
This book discusses the theory of quantum effects used in metrology, and presents the authors research findings in the field of quantum electronics. It also describes the quantum measurement standards used in various branches of metrology, such as those relating to electrical quantities, mass, length, time and frequency. The first comprehensive survey of quantum metrology problems, it introduces a new approach to  Read more...
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Genre/Form: Electronic books
Additional Physical Format: Printed edition:
Printed edition:
Printed edition:
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Waldemar Nawrocki
ISBN: 9783030196776 3030196771 3030196763 9783030196769 9783030196783 303019678X 9783030196790 3030196798
OCLC Number: 1103319975
Description: 1 online resource : illustrations (some color)
Contents: Preface --
Theoretical Background of Quantum Metrology --
Measurements, Standards and Systems of Units --
The Revised SI System of Units --
Quantum Voltage Standards --
SQUID Detectors of Magnetic Flux --
Quantum Hall Effect and the Resistance Standard --
Quantization of Electrical Conductance and Thermal Conductance in Nanostructures --
Single Electron Tunneling --
Atomic Clocks and Time Scales --
Standards and Measurements of Length --
Satellite Navigation Systems --
Scanning Probe Microscopes --
New Standards of Mass.
Other Titles: Wstęp do metrologii kwantowej.
Responsibility: Waldemar Nawrocki.

Abstract:

This book discusses the theory of quantum effects used in metrology, and presents the author's research findings in the field of quantum electronics.  Read more...

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