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Label-free super-resolving microscopy with nanoparticles

Author: Omer Wagner; Zeev Zalevsky; Society of Photo-optical Instrumentation Engineers,
Publisher: Bellingham, Washington (1000 20th St. Bellingham WA 98225-6705 USA) : SPIE, 2018.
Series: SPIE spotlight, vol. SL44.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
This Spotlight reviews the development of label-free, nanoparticle-based nanoscopy concepts, including (1) multiwavelength time-modulation illumination to enhance the signal-to-noise ratio (SNR) and reduce the overall time to map the full field of view; (2) time-dependent polarization modulation to enhance the resolution and SNR; (3) free versus controlled nanoparticle movement; (4) image-processing concepts to  Read more...
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Genre/Form: Electronic books
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Omer Wagner; Zeev Zalevsky; Society of Photo-optical Instrumentation Engineers,
ISBN: 9781510623040 1510623043
OCLC Number: 1056690981
Description: 1 online resource (vi, 22 pages).
Contents: Preface --
1. Introduction: 1.1. Classical resolution limit; 1.2. Labeled and label-free super-resolution techniques --
2. Nanoparticles-based methods as environmental features for label-free super-resolution: 2.1. Materials and methods --
3. Conclusion --
References.
Series Title: SPIE spotlight, vol. SL44.
Responsibility: by Omer Wagner and Zeev Zalevsky.

Abstract:

This Spotlight reviews the development of label-free, nanoparticle-based nanoscopy concepts, including (1) multiwavelength time-modulation illumination to enhance the signal-to-noise ratio (SNR) and reduce the overall time to map the full field of view; (2) time-dependent polarization modulation to enhance the resolution and SNR; (3) free versus controlled nanoparticle movement; (4) image-processing concepts to improve localization capabilities; and (5) realization of 3-D nanoscopy.

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