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  E-mail Message: I thought you might be interested in this item at http://www.worldcat.org/oclc/209908125 Title: Leakage in nanometer CMOS technologies Author: Siva G Narendra; Anantha P Chandrakasan Publisher: New York : Springer, 2006. ISBN/ISSN: 9780387281339 0387281339 0387257373 9780387257372 6610616582 9786610616589 OCLC:209908125

  
  

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Leakage in nanometer CMOS technologies

Author:	Siva G Narendra; Anantha P Chandrakasan
Publisher:	New York : Springer, 2006.
Series:	Series on integrated circuits and systems.
Edition/Format:	eBook : Document : EnglishView all editions and formats
Summary:	Scaling transistors into the nanometer regime has resulted in a dramatic increase in MOS leakage (i.e., off-state) current. Threshold voltages of transistors have scaled to maintain performance at reduced power supply voltages. Leakage current has become a major portion of the total power consumption, and in many scaled technologies leakage contributes 30-50% of the overall power consumption under nominal operating conditions. Leakage is important in a variety of different contexts. For example, in desktop applications, active leakage power (i.e., leakage power when the processor is computing) is becoming significant compared to switching power. In battery operated systems, standby leakage (i.e., leakage when the processor clock is turned off) dominates as energy is drawn over long idle periods. Increased transistor leakages not only impact the overall power consumed by a CMOS system, but also reduce the margins available for design due to the strong relationship between process variation and leakage power. It is essential for circuit and system designers to understand the components of leakage, sensitivity of leakage to different design parameters, and leakage mitigation techniques in nanometer technologies. This book provides an in-depth treatment of these issues for researchers and product designers.  Read more...
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Subjects	Metal oxide semiconductors, Complementary -- Design and construction. Integrated circuits -- Design and construction. Electric leakage -- Prevention. View all subjects
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