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Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California Preview this item
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Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California

Author: L R Baker; Harold Earl Bennett; Sira Limited.
Publisher: Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, ©1985.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 525.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Online version:
Measurement and effects of surface defects and quality of polish.
Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, ©1985
(OCoLC)567617229
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: L R Baker; Harold Earl Bennett; Sira Limited.
ISBN: 0892525606 9780892525607
OCLC Number: 12620110
Description: vi, 198 pages : illustrations ; 28 cm.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 525.
Responsibility: cosponsor Sira Ltd.--The research association for instrumentation ; Lionel R. Baker, Harold E. Bennett, chairmen/editors.

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Primary Entity<\/h3>
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Related Entities<\/h3>
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<http:\/\/experiment.worldcat.org\/entity\/work\/data\/5143874#Agent\/spie_the_international_society_for_optical_engineering<\/a>> # SPIE--the International Society for Optical Engineering<\/span>\u00A0\u00A0\u00A0\u00A0a bgn:Agent<\/a> ;\u00A0\u00A0\u00A0schema:name<\/a> \"SPIE--the International Society for Optical Engineering<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/5143874#Place\/bellingham_wash_usa<\/a>> # Bellingham, Wash., USA<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Place<\/a> ;\u00A0\u00A0\u00A0schema:name<\/a> \"Bellingham, Wash., USA<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/5143874#Series\/proceedings_of_spie_the_international_society_for_optical_engineering<\/a>> # Proceedings of SPIE--the International Society for Optical Engineering ;<\/span>\u00A0\u00A0\u00A0\u00A0a bgn:PublicationSeries<\/a> ;\u00A0\u00A0\u00A0schema:hasPart<\/a> <http:\/\/www.worldcat.org\/oclc\/12620110<\/a>> ; # Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California<\/span>\u00A0\u00A0\u00A0schema:name<\/a> \"Proceedings of SPIE--the International Society for Optical Engineering ;<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/5143874#Topic\/lenses_defects<\/a>> # Lenses--Defects<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Intangible<\/a> ;\u00A0\u00A0\u00A0schema:hasPart<\/a> <http:\/\/id.loc.gov\/authorities\/subjects\/sh85075999<\/a>> ;\u00A0\u00A0\u00A0schema:name<\/a> \"Lenses--Defects<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.<\/div>
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<http:\/\/viaf.org\/viaf\/133355789<\/a>> # Sira Limited.<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Organization<\/a> ;\u00A0\u00A0\u00A0schema:name<\/a> \"Sira Limited.<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/viaf.org\/viaf\/273546365<\/a>> # Lionel R. Baker<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Person<\/a> ;\u00A0\u00A0\u00A0schema:familyName<\/a> \"Baker<\/span>\" ;\u00A0\u00A0\u00A0schema:givenName<\/a> \"Lionel R.<\/span>\" ;\u00A0\u00A0\u00A0schema:givenName<\/a> \"L. R.<\/span>\" ;\u00A0\u00A0\u00A0schema:name<\/a> \"Lionel R. Baker<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/viaf.org\/viaf\/3778394<\/a>> # Harold Earl Bennett<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Person<\/a> ;\u00A0\u00A0\u00A0schema:birthDate<\/a> \"1929<\/span>\" ;\u00A0\u00A0\u00A0schema:familyName<\/a> \"Bennett<\/span>\" ;\u00A0\u00A0\u00A0schema:givenName<\/a> \"Harold Earl<\/span>\" ;\u00A0\u00A0\u00A0schema:name<\/a> \"Harold Earl Bennett<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/worldcat.org\/isbn\/9780892525607<\/a>>\u00A0\u00A0\u00A0\u00A0a schema:ProductModel<\/a> ;\u00A0\u00A0\u00A0schema:isbn<\/a> \"0892525606<\/span>\" ;\u00A0\u00A0\u00A0schema:isbn<\/a> \"9780892525607<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/www.worldcat.org\/oclc\/567617229<\/a>>\u00A0\u00A0\u00A0\u00A0a schema:CreativeWork<\/a> ;\u00A0\u00A0\u00A0rdfs:label<\/a> \"Measurement and effects of surface defects and quality of polish.<\/span>\" ;\u00A0\u00A0\u00A0schema:description<\/a> \"Online version:<\/span>\" ;\u00A0\u00A0\u00A0schema:isSimilarTo<\/a> <http:\/\/www.worldcat.org\/oclc\/12620110<\/a>> ; # Measurement and effects of surface defects and quality of polish : January 21-22, 1985, Los Angeles, California<\/span>\u00A0\u00A0\u00A0\u00A0.<\/div>
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Content-negotiable representations<\/p>