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Measuring intelligence; a guide to the administration of the new revised Stanford-Binet tests of intelligence,

Author: Lewis M Terman; Maud Amanda Merrill
Publisher: Boston, Houghton [©1937]
Series: Riverside textbooks in education.
Edition/Format:   Print book : EnglishView all editions and formats
Database:WorldCat
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Additional Physical Format: Online version:
Terman, Lewis Madison, 1877-1956.
Measuring intelligence.
Boston, New York [etc.] Houghton Mifflin Co. [©1937]
(OCoLC)557712662
Online version:
Terman, Lewis Madison, 1877-1956.
Measuring intelligence.
Boston, New York [etc.] Houghton Mifflin Co. [©1937]
(OCoLC)608576847
Document Type: Book
All Authors / Contributors: Lewis M Terman; Maud Amanda Merrill
OCLC Number: 964301
Description: xi, 460 pages illustrations.
Series Title: Riverside textbooks in education.
Other Titles: Stanford-Binet tests of intelligence
Responsibility: by Lewis M. Terman and Maud A. Merrill.

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