Microelectronics reliability. (Journal, magazine, 1998) [WorldCat.org]
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Microelectronics reliability.

Publisher: Oxford ; New York : Pergamon Press, 1998-
Edition/Format:   Journal, magazine : Periodical : EnglishView all editions and formats
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Genre/Form: Periodicals
Material Type: Periodical
Document Type: Journal / Magazine / Newspaper
ISSN:0026-2714
OCLC Number: 222428916
Description: volumes : illustrations ; 26-27 cm

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