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Microstructural analysis tools and techniques.

Author: James L McCall; William M Mueller; International Metallographic Society.; American Society for Metals.
Publisher: New York, Plenum Press, 1973.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: James L McCall; William M Mueller; International Metallographic Society.; American Society for Metals.
ISBN: 0306307480 9780306307485
OCLC Number: 707557
Notes: "Proceedings of a symposium held September 17-18, 1972, in Chicago, Illinois ... sponsored by the International Metallographic Society and the American Society for Metals."
Description: viii, 343 pages illustrations 26 cm
Contents: Photographic Techniques for Optical Microscopy and Macroscopy.- Specimen Preparation Methods for Microstructural Analysis.- Quantitative Stereology for Microstructural Analysis.- Devices for Quantitative Analysis.- Scanning Electron Microscopy for Microstructural Analysis.- High Voltage Electron Microscopy for Microstructural Analysis.- Microstructural Analysis and Fractography.- X-Ray Diffraction Microscopy.- Computers in Microstructural Analysis.- Use of Leed, Auger Emission Spectroscopy and Field Ion Microscopy in Microstructural Studies.- Microstructural Studies Using the Electron Microprobe Analyzer.- Ion Probe Mass Spectrometry Analysis of Microstructures.- Ion Scattering Spectroscopy for Microstructural Analysis.- Author Index.
Responsibility: Edited by James L. McCall and William M. Mueller.

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<http:\/\/viaf.org\/viaf\/275467089<\/a>> # William M. Mueller<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Person<\/a> ;\u00A0\u00A0\u00A0\nschema:familyName<\/a> \"Mueller<\/span>\" ;\u00A0\u00A0\u00A0\nschema:givenName<\/a> \"William M.<\/span>\" ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"William M. Mueller<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
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