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Genre/Form: | Thèses et écrits académiques |
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Material Type: | Document, Thesis/dissertation, Internet resource |
Document Type: | Internet Resource, Computer File |
All Authors / Contributors: |
Enguerrand Couka; Dominique Jeulin, matheÌmaticien).; École nationale supérieure des mines (Paris).; École doctorale Sciences des métiers de l'ingénieur (Paris).; Centre de morphologie mathématique (Fontainebleau, Seine et Marne). |
OCLC Number: | 945923177 |
Notes: | Titre provenant de l'écran-titre. |
Description: | 1 online resource |
Responsibility: | Enguerrand Couka ; sous la direction de Dominique Jeulin. |
Abstract:
This work presents a numerical and theoretical study of the optical properties of paint layers, in the classical framework of homogenization of heterogeneous media. Objectives are : describing and modeling the heterogenous microstructures used in paint coatings, and predicting the optical response of such materials by numerical ways, depending of the pigments morphology. This work was carried out as part of the LIMA project (Light Interaction Materials Aspect), in partnership with the Agence Nationale de la Recherche and the PSA company. Images of differents paint layers are acquired by scanning electron microscopy (SEM). Different length scales are considered for the microstructures and pigments : microscopic and nanoscopic. Representatives images of these scales are chosen and segmented in order to estimate morphological measurements. Using these measurements, random models are developed depending on the scales. These models, of a multiscale nature, are optimized and validated. The prediction of the optical behaviour of random models describing heterogenous materials is carried out using numerical process based on fast Fourier transforms (FFT). Optics of composite materials theory is introduced, as well as the limits of FFT methods. The quasi-static approximation is a constraint which implies the use of the FFT method on the nanoscopic model only. Dielectric functions of the components of the paint have been measured on macroscopic samples at the Museum of Mineralogy of Mines de Paris by spectroscopic ellipsometry. The optical response of the optimized nanoscopic model is computed and compared to ellipsometry measurements carried out on a reference paint layer. The computed and measured responses are also compared with analytical estimates. In addition, a statistical characterization is made on the random model and the local dielectrical displacement fields, by using the representative volume element (RVE).
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