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Models for uncertainty in educational testing

Author: Nicholas T Longford
Publisher: New York : Springer-Verlag, ©1995.
Series: Springer series in statistics.
Edition/Format:   Print book : EnglishView all editions and formats
Summary:
"The aim of this monograph is to present a survey of modern statistical techniques applied to educational and psychological testing. A theme that runs through this book is that of making inferences about sources of variation or uncertainty. The author shows how information about these sources can be used for improved (shrinkage) estimation of certain elementary quantities. Among the topics covered are essay rating,  Read more...
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Document Type: Book
All Authors / Contributors: Nicholas T Longford
ISBN: 038794513X 9780387945132
OCLC Number: 32166087
Description: xiv, 285 pages : illustrations ; 25 cm.
Contents: 1. Inference about variation --
2. Reliability of essay rating --
3. Adjusting subjectively rated scores --
4. Rating several essays --
5. Summarizing item-level properties --
6. Equating and equivalence of tests --
7. Inference from surveys with complex sampling design --
8. Small-area estimation --
9. Cut scores for pass/fail decisions --
10. Incomplete longitudinal data.
Series Title: Springer series in statistics.
Responsibility: Nicholas T. Longford.

Abstract:

A theme running through this book is that of making inference about sources of variation or uncertainty, and the author shows how information about these sources can be used for improved estimation  Read more...

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