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Modern applied statistics with S

Author: W N Venables; Brian D Ripley
Publisher: New York : Springer, [2002] ©2002
Series: Statistics and computing.
Edition/Format:   Print book : English : 4th edView all editions and formats
Summary:
S is a powerful environment for the statistical and graphical analysis of data. It provides the tools to implement many statistical ideas that have been made possible by the widespread availability of workstations having good graphics and computational capabilities. This book is a guide to using S environments to perform statistical analyses and provides both an introduction to the use of S and a course in modern  Read more...
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Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: W N Venables; Brian D Ripley
ISBN: 0387954570 9780387954578 9781441930088 1441930086
OCLC Number: 49312402
Notes: Previously published as: Modern applied statistics with S-PLUS, ©1999.
Description: xi, 495 pages : illustrations ; 25 cm.
Contents: 1. Introduction --
2. Data manipulation --
3. The S language --
4. Graphics --
5. Univariate statistics --
6. Linear statistical models --
7. Generalized linear models --
8. Non-linear and smooth regression --
9. Tree-based methods --
10. Random and mixed effects --
11. Exploratory multivariate analysis --
12. Classification --
13. Survival analysis --
14. Time series analysis --
15. Spatial statistics --
16. Optimization --
Appendix A. Implementation specific details --
Appendix B. The S-PLUS GUI --
Appendix C. Datasets, software and libraries --
References --
Index.
Series Title: Statistics and computing.
Responsibility: W.N. Venables, B.D. Ripley.
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Abstract:

A guide to using S environments to perform statistical analyses providing both an introduction to the use of S and a course in modern statistical methods. The emphasis is on presenting practical  Read more...

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"Modern Applied Statistics With S meets its goal of serving as an introduction to S for new users, as well as a reference and resource for those with more S experience." Journal of the American Read more...

 
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