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Modulation measurements for microwave mixers

Author: James M Kenney
Publisher: [Washington, D.C.] : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1980.
Series: Semiconductor measurement technology.; NBS special publication, 400-16.
Edition/Format:   Print book : National government publication : EnglishView all editions and formats
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Additional Physical Format: Online version:
Kenney, James M.
Modulation measurements for microwave mixers.
[Washington, D.C.] : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1980
(OCoLC)604461481
Online version:
Kenney, James M.
Modulation measurements for microwave mixers.
[Washington, D.C.] : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1980
(OCoLC)615842734
Material Type: Government publication, National government publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: James M Kenney
OCLC Number: 6068240
Notes: "Issued February 1980."
Description: v, 80 pages : illustrations ; 27 cm.
Series Title: Semiconductor measurement technology.; NBS special publication, 400-16.
Responsibility: James M. Kenney.

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Primary Entity<\/h3>\n
<http:\/\/www.worldcat.org\/oclc\/6068240<\/a>> # Modulation measurements for microwave mixers<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Book<\/a>, schema:CreativeWork<\/a> ;\u00A0\u00A0\u00A0\nlibrary:oclcnum<\/a> \"6068240<\/span>\" ;\u00A0\u00A0\u00A0\nlibrary:placeOfPublication<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/1973444515#Place\/washington_d_c<\/a>> ; # Washington, D.C.<\/span>\n\u00A0\u00A0\u00A0\nlibrary:placeOfPublication<\/a> <http:\/\/id.loc.gov\/vocabulary\/countries\/dcu<\/a>> ;\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/1973444515#Topic\/microwave_mixers_testing<\/a>> ; # Microwave mixers--Testing<\/span>\n\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/1973444515#Topic\/diodes_a_semiconducteur_essais<\/a>> ; # Diodes \u00E0 semiconducteur--Essais<\/span>\n\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/1973444515#Topic\/mesures_microondes<\/a>> ; # Mesures microondes<\/span>\n\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/id.worldcat.org\/fast\/1024511<\/a>> ; # Modulation (Electronics)<\/span>\n\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/id.worldcat.org\/fast\/1020233<\/a>> ; # Microwave measurements<\/span>\n\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/dewey.info\/class\/602.18\/e19\/<\/a>> ;\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/1973444515#Topic\/diodes_semiconductor_testing<\/a>> ; # Diodes, Semiconductor--Testing<\/span>\n\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/1973444515#Topic\/modulation_electronique_mesure<\/a>> ; # Modulation (\u00E9lectronique)--Mesure<\/span>\n\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/id.worldcat.org\/fast\/894055<\/a>> ; # Diodes, Semiconductor--Testing<\/span>\n\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/id.worldcat.org\/fast\/1020235<\/a>> ; # Microwave mixers--Testing<\/span>\n\u00A0\u00A0\u00A0\nschema:bookFormat<\/a> bgn:PrintBook<\/a> ;\u00A0\u00A0\u00A0\nschema:creator<\/a> <http:\/\/viaf.org\/viaf\/269448989<\/a>> ; # James M. Kenney<\/span>\n\u00A0\u00A0\u00A0\nschema:datePublished<\/a> \"1980<\/span>\" ;\u00A0\u00A0\u00A0\nschema:exampleOfWork<\/a> <http:\/\/worldcat.org\/entity\/work\/id\/1973444515<\/a>> ;\u00A0\u00A0\u00A0\nschema:genre<\/a> \"Government publication<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\nschema:genre<\/a> \"National government publication<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\nschema:inLanguage<\/a> \"en<\/span>\" ;\u00A0\u00A0\u00A0\nschema:isPartOf<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/1973444515#Series\/nbs_special_publication<\/a>> ; # NBS special publication ;<\/span>\n\u00A0\u00A0\u00A0\nschema:isPartOf<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/1973444515#Series\/semiconductor_measurement_technology<\/a>> ; # Semiconductor measurement technology.<\/span>\n\u00A0\u00A0\u00A0\nschema:isSimilarTo<\/a> <http:\/\/www.worldcat.org\/oclc\/604461481<\/a>> ;\u00A0\u00A0\u00A0\nschema:isSimilarTo<\/a> <http:\/\/www.worldcat.org\/oclc\/615842734<\/a>> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Modulation measurements for microwave mixers<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\nschema:productID<\/a> \"6068240<\/span>\" ;\u00A0\u00A0\u00A0\nschema:publication<\/a> <http:\/\/www.worldcat.org\/title\/-\/oclc\/6068240#PublicationEvent\/washington_d_c_u_s_dept_of_commerce_national_bureau_of_standards_for_sale_by_the_supt_of_docs_u_s_govt_print_off_1980<\/a>> ;\u00A0\u00A0\u00A0\nschema:publisher<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/1973444515#Agent\/u_s_dept_of_commerce_national_bureau_of_standards<\/a>> ; # U.S. Dept. of Commerce, National Bureau of Standards<\/span>\n\u00A0\u00A0\u00A0\nschema:publisher<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/1973444515#Agent\/for_sale_by_the_supt_of_docs_u_s_govt_print_off<\/a>> ; # For sale by the Supt. of Docs., U.S. Govt. Print. Off.<\/span>\n\u00A0\u00A0\u00A0\nwdrs:describedby<\/a> <http:\/\/www.worldcat.org\/title\/-\/oclc\/6068240<\/a>> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n\n

Related Entities<\/h3>\n
<http:\/\/dewey.info\/class\/602.18\/e19\/<\/a>>\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/1973444515#Agent\/for_sale_by_the_supt_of_docs_u_s_govt_print_off<\/a>> # For sale by the Supt. of Docs., U.S. Govt. Print. Off.<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nbgn:Agent<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"For sale by the Supt. of Docs., U.S. Govt. Print. Off.<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/1973444515#Agent\/u_s_dept_of_commerce_national_bureau_of_standards<\/a>> # U.S. Dept. of Commerce, National Bureau of Standards<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nbgn:Agent<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"U.S. Dept. of Commerce, National Bureau of Standards<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/1973444515#Place\/washington_d_c<\/a>> # Washington, D.C.<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Place<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Washington, D.C.<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/1973444515#Series\/nbs_special_publication<\/a>> # NBS special publication ;<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nbgn:PublicationSeries<\/a> ;\u00A0\u00A0\u00A0\nschema:hasPart<\/a> <http:\/\/www.worldcat.org\/oclc\/6068240<\/a>> ; # Modulation measurements for microwave mixers<\/span>\n\u00A0\u00A0\u00A0\nschema:name<\/a> \"NBS special publication ;<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/1973444515#Series\/semiconductor_measurement_technology<\/a>> # Semiconductor measurement technology.<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nbgn:PublicationSeries<\/a> ;\u00A0\u00A0\u00A0\nschema:hasPart<\/a> <http:\/\/www.worldcat.org\/oclc\/6068240<\/a>> ; # Modulation measurements for microwave mixers<\/span>\n\u00A0\u00A0\u00A0\nschema:name<\/a> \"Semiconductor measurement technology.<\/span>\" ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Semiconductor measurement technology<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/1973444515#Topic\/diodes_a_semiconducteur_essais<\/a>> # Diodes \u00E0 semiconducteur--Essais<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Diodes \u00E0 semiconducteur--Essais<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/1973444515#Topic\/diodes_semiconductor_testing<\/a>> # Diodes, Semiconductor--Testing<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\nschema:hasPart<\/a> <http:\/\/id.loc.gov\/authorities\/subjects\/sh85038108<\/a>> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Diodes, Semiconductor--Testing<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/1973444515#Topic\/mesures_microondes<\/a>> # Mesures microondes<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Mesures microondes<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/1973444515#Topic\/microwave_mixers_testing<\/a>> # Microwave mixers--Testing<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\nschema:hasPart<\/a> <http:\/\/id.loc.gov\/authorities\/subjects\/sh85084967<\/a>> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Microwave mixers--Testing<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/1973444515#Topic\/modulation_electronique_mesure<\/a>> # Modulation (\u00E9lectronique)--Mesure<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Modulation (\u00E9lectronique)--Mesure<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/id.loc.gov\/vocabulary\/countries\/dcu<\/a>>\u00A0\u00A0\u00A0\u00A0a \nschema:Place<\/a> ;\u00A0\u00A0\u00A0\ndcterms:identifier<\/a> \"dcu<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/id.worldcat.org\/fast\/1020233<\/a>> # Microwave measurements<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Microwave measurements<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/id.worldcat.org\/fast\/1020235<\/a>> # Microwave mixers--Testing<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Microwave mixers--Testing<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/id.worldcat.org\/fast\/1024511<\/a>> # Modulation (Electronics)<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Modulation (Electronics)<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/id.worldcat.org\/fast\/894055<\/a>> # Diodes, Semiconductor--Testing<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Intangible<\/a> ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"Diodes, Semiconductor--Testing<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/viaf.org\/viaf\/269448989<\/a>> # James M. Kenney<\/span>\n\u00A0\u00A0\u00A0\u00A0a \nschema:Person<\/a> ;\u00A0\u00A0\u00A0\nschema:familyName<\/a> \"Kenney<\/span>\" ;\u00A0\u00A0\u00A0\nschema:givenName<\/a> \"James M.<\/span>\" ;\u00A0\u00A0\u00A0\nschema:name<\/a> \"James M. Kenney<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/www.worldcat.org\/oclc\/604461481<\/a>>\u00A0\u00A0\u00A0\u00A0a \nschema:CreativeWork<\/a> ;\u00A0\u00A0\u00A0\nrdfs:label<\/a> \"Modulation measurements for microwave mixers.<\/span>\" ;\u00A0\u00A0\u00A0\nschema:description<\/a> \"Online version:<\/span>\" ;\u00A0\u00A0\u00A0\nschema:isSimilarTo<\/a> <http:\/\/www.worldcat.org\/oclc\/6068240<\/a>> ; # Modulation measurements for microwave mixers<\/span>\n\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/www.worldcat.org\/oclc\/615842734<\/a>>\u00A0\u00A0\u00A0\u00A0a \nschema:CreativeWork<\/a> ;\u00A0\u00A0\u00A0\nrdfs:label<\/a> \"Modulation measurements for microwave mixers.<\/span>\" ;\u00A0\u00A0\u00A0\nschema:description<\/a> \"Online version:<\/span>\" ;\u00A0\u00A0\u00A0\nschema:isSimilarTo<\/a> <http:\/\/www.worldcat.org\/oclc\/6068240<\/a>> ; # Modulation measurements for microwave mixers<\/span>\n\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/www.worldcat.org\/title\/-\/oclc\/6068240<\/a>>\u00A0\u00A0\u00A0\u00A0a \ngenont:InformationResource<\/a>, genont:ContentTypeGenericResource<\/a> ;\u00A0\u00A0\u00A0\nschema:about<\/a> <http:\/\/www.worldcat.org\/oclc\/6068240<\/a>> ; # Modulation measurements for microwave mixers<\/span>\n\u00A0\u00A0\u00A0\nschema:dateModified<\/a> \"2018-12-18<\/span>\" ;\u00A0\u00A0\u00A0\nvoid:inDataset<\/a> <http:\/\/purl.oclc.org\/dataset\/WorldCat<\/a>> ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n
<http:\/\/www.worldcat.org\/title\/-\/oclc\/6068240#PublicationEvent\/washington_d_c_u_s_dept_of_commerce_national_bureau_of_standards_for_sale_by_the_supt_of_docs_u_s_govt_print_off_1980<\/a>>\u00A0\u00A0\u00A0\u00A0a \nschema:PublicationEvent<\/a> ;\u00A0\u00A0\u00A0\nschema:location<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/1973444515#Place\/washington_d_c<\/a>> ; # Washington, D.C.<\/span>\n\u00A0\u00A0\u00A0\nschema:organizer<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/1973444515#Agent\/for_sale_by_the_supt_of_docs_u_s_govt_print_off<\/a>> ; # For sale by the Supt. of Docs., U.S. Govt. Print. Off.<\/span>\n\u00A0\u00A0\u00A0\nschema:organizer<\/a> <http:\/\/experiment.worldcat.org\/entity\/work\/data\/1973444515#Agent\/u_s_dept_of_commerce_national_bureau_of_standards<\/a>> ; # U.S. Dept. of Commerce, National Bureau of Standards<\/span>\n\u00A0\u00A0\u00A0\nschema:startDate<\/a> \"1980<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.\n\n\n<\/div>\n\n

Content-negotiable representations<\/p>\n