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Multi-run memory tests for pattern sensitive faults

Author: Ireneusz Mrozek
Publisher: Cham : Springer, [2019] ©2019
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described  Read more...
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Genre/Form: Electronic books
Additional Physical Format: Printed edition:
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Ireneusz Mrozek
ISBN: 9783319912042 3319912046 3319912038 9783319912035 9783319912059 3319912054 9783030081980 3030081982
OCLC Number: 1043830782
Description: 1 online resource
Contents: Introduction to digital memory --
Basics of functional RAM testing --
Multi-cell faults --
Controlled random testing --
Multi-run tests based on background changing --
Multi-run tests based on address changing --
Multiple controlled random testing --
Pseudo exhaustive testing based on march tests --
Conclusion.
Responsibility: Ireneusz Mrozek.

Abstract:

This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory.  Read more...

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