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Author: Angus Kirkland; Sarah J Haigh
Publisher: Cambridge, UK : Royal Society of Chemistry, [2015]
Series: RSC nanoscience & nanotechnology.
Edition/Format:   Print book : English : 2nd editionView all editions and formats

This new edition has been fully revised and updated to reflect the recent developments in instrumental characterisation methods for nanostructured materials.


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Document Type: Book
All Authors / Contributors: Angus Kirkland; Sarah J Haigh
ISBN: 9781849738057 184973805X
OCLC Number: 923728256
Description: xvi, 358 pages : illustrations (some color) ; 24 cm.
Contents: Characterization of Nanomaterials using Transmission Electron Microscopy; Characterization of Nanomaterials using Scanning Transmission Electron Microscopy; Scanning Probe Microscopy of Nanostructures; Electron Energy Loss Spectroscopy and Energy Dispersive X-ray Analysis in Nanostructure Characterisation; Measurements of Fields in Nanostructures; 3D Characterisation of Nanostructures; Scanning Electron and Ion Microscopy at the Nanoscale; In situ Microscopy of Nanomaterials;
Series Title: RSC nanoscience & nanotechnology.
Responsibility: edited by Angus I. Kirkland, University of Oxford, UK and Sarah J. Haigh, University of Manchester, UK.


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This text contains very well-referenced chapters on the newest advances in nanoscale imaging and microscopy and would be a welcome addition to the shelf of any research microscopist who wishes to Read more...

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