NANOFIM-2017 : 3rd International Conference on Nanotechnology for Instrumentation & Measurement Workshop (16th-17th November, 2017) : IEEE Conference ID-43102 (Book, 2017) [WorldCat.org]
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NANOFIM-2017 : 3rd International Conference on Nanotechnology for Instrumentation & Measurement Workshop (16th-17th November, 2017) : IEEE Conference ID-43102
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NANOFIM-2017 : 3rd International Conference on Nanotechnology for Instrumentation & Measurement Workshop (16th-17th November, 2017) : IEEE Conference ID-43102

Author: Shabana Urooj
Publisher: New Delhi : Excel India Publishers, November-2017
Edition/Format:   Print book : Conference publication : English : First impression
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Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Shabana Urooj
ISBN: 9789386724182 9386724189
OCLC Number: 1021370258
Description: xxiii, 528 Seiten. : Diagramme, Illustrationen.
Responsibility: Editor Dr. Shabana Urooj ; organized by Electrical Engineering Deoartment School of Engineering & IEEE-GBU SB Gautam Buddha University Greater Noida, Uttar Pradesh-201312, India.

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