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On the dynamics of short pressure probes : some design factors affecting frequency response

Author: Ted W Nyland; David R Englund; Robert C Anderson; United States. National Aeronautics and Space Administration.; Lewis Research Center.
Publisher: Washington, D.C. : National Aeronautics and Space Administration ; Springfield, VA : For sale by the Clearinghouse for Federal Scientific and Technical Information, 1971.
Series: NASA technical note, D-6151.
Edition/Format:   Print book : National government publication : EnglishView all editions and formats
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Additional Physical Format: Online version:
Nyland, Ted W.
On the dynamics of short pressure probes.
Washington, D.C. : National Aeronautics and Space Administration ; Springfield, VA : For sale by the Clearinghouse for Federal Scientific and Technical Information, 1971
(OCoLC)760993316
Material Type: Government publication, National government publication
Document Type: Book
All Authors / Contributors: Ted W Nyland; David R Englund; Robert C Anderson; United States. National Aeronautics and Space Administration.; Lewis Research Center.
OCLC Number: 184936556
Notes: Prepared by Lewis Research Center, Cleveland, Ohio, 44135.
Description: 25 pages : illustrations ; 27 cm.
Series Title: NASA technical note, D-6151.
Other Titles: NASA TN D-6151
Responsibility: Ted W. Nyland, David R. Englund, Robert C. Anderson.

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Related Entities<\/h3>
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/145658869#Agent\/for_sale_by_the_clearinghouse_for_federal_scientific_and_technical_information<\/a>> # For sale by the Clearinghouse for Federal Scientific and Technical Information<\/span>\u00A0\u00A0\u00A0\u00A0a bgn:Agent<\/a> ;\u00A0\u00A0\u00A0schema:name<\/a> \"For sale by the Clearinghouse for Federal Scientific and Technical Information<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/145658869#Agent\/national_aeronautics_and_space_administration<\/a>> # National Aeronautics and Space Administration<\/span>\u00A0\u00A0\u00A0\u00A0a bgn:Agent<\/a> ;\u00A0\u00A0\u00A0schema:name<\/a> \"National Aeronautics and Space Administration<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
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<http:\/\/experiment.worldcat.org\/entity\/work\/data\/145658869#Place\/springfield_va<\/a>> # Springfield, VA<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Place<\/a> ;\u00A0\u00A0\u00A0schema:name<\/a> \"Springfield, VA<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/145658869#Place\/washington_d_c<\/a>> # Washington, D.C.<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Place<\/a> ;\u00A0\u00A0\u00A0schema:name<\/a> \"Washington, D.C.<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/145658869#Series\/nasa_technical_note<\/a>> # NASA technical note ;<\/span>\u00A0\u00A0\u00A0\u00A0a bgn:PublicationSeries<\/a> ;\u00A0\u00A0\u00A0schema:hasPart<\/a> <http:\/\/www.worldcat.org\/oclc\/184936556<\/a>> ; # On the dynamics of short pressure probes : some design factors affecting frequency response<\/span>\u00A0\u00A0\u00A0schema:name<\/a> \"NASA technical note ;<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/experiment.worldcat.org\/entity\/work\/data\/145658869#Topic\/frequency_response_electrical_engineering_testing<\/a>> # Frequency response (Electrical engineering)--Testing<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Intangible<\/a> ;\u00A0\u00A0\u00A0schema:hasPart<\/a> <http:\/\/id.loc.gov\/authorities\/subjects\/sh85051932<\/a>> ;\u00A0\u00A0\u00A0schema:name<\/a> \"Frequency response (Electrical engineering)--Testing<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/id.loc.gov\/authorities\/subjects\/sh85106532<\/a>> # Pressure--Measurement<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Intangible<\/a> ;\u00A0\u00A0\u00A0schema:name<\/a> \"Pressure--Measurement<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/id.loc.gov\/vocabulary\/countries\/dcu<\/a>>\u00A0\u00A0\u00A0\u00A0a schema:Place<\/a> ;\u00A0\u00A0\u00A0dcterms:identifier<\/a> \"dcu<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/id.worldcat.org\/fast\/1075934<\/a>> # Pressure--Measurement<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Intangible<\/a> ;\u00A0\u00A0\u00A0schema:name<\/a> \"Pressure--Measurement<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/id.worldcat.org\/fast\/1132021<\/a>> # Static pressure probes<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Intangible<\/a> ;\u00A0\u00A0\u00A0schema:name<\/a> \"Static pressure probes<\/span>\"@en<\/a> ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/viaf.org\/viaf\/12141729<\/a>> # Ted W. Nyland<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Person<\/a> ;\u00A0\u00A0\u00A0schema:familyName<\/a> \"Nyland<\/span>\" ;\u00A0\u00A0\u00A0schema:givenName<\/a> \"Ted W.<\/span>\" ;\u00A0\u00A0\u00A0schema:name<\/a> \"Ted W. Nyland<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
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<http:\/\/viaf.org\/viaf\/62919098<\/a>> # David R. Englund<\/span>\u00A0\u00A0\u00A0\u00A0a schema:Person<\/a> ;\u00A0\u00A0\u00A0schema:familyName<\/a> \"Englund<\/span>\" ;\u00A0\u00A0\u00A0schema:givenName<\/a> \"David R.<\/span>\" ;\u00A0\u00A0\u00A0schema:name<\/a> \"David R. Englund<\/span>\" ;\u00A0\u00A0\u00A0\u00A0.<\/div>
<http:\/\/www.worldcat.org\/oclc\/760993316<\/a>>\u00A0\u00A0\u00A0\u00A0a schema:CreativeWork<\/a> ;\u00A0\u00A0\u00A0rdfs:label<\/a> \"On the dynamics of short pressure probes.<\/span>\" ;\u00A0\u00A0\u00A0schema:description<\/a> \"Online version:<\/span>\" ;\u00A0\u00A0\u00A0schema:isSimilarTo<\/a> <http:\/\/www.worldcat.org\/oclc\/184936556<\/a>> ; # On the dynamics of short pressure probes : some design factors affecting frequency response<\/span>\u00A0\u00A0\u00A0\u00A0.<\/div>
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Content-negotiable representations<\/p>