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Optical pattern recognition XV : 15-16 April 2004, Orlando, Florida, USA

Author: D P Casasent; Tien-Hsin Chao; Society of Photo-optical Instrumentation Engineers.
Publisher: Bellingham, Wash., USA : SPIE, ©2004.
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 5437.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Summary:

Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: D P Casasent; Tien-Hsin Chao; Society of Photo-optical Instrumentation Engineers.
ISBN: 0819453609 9780819453600
OCLC Number: 55653238
Description: viii, 320 pages : illustrations ; 28 cm.
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 5437.
Other Titles: Optical pattern recognition 15
Optical pattern recognition fifteen
Responsibility: David P. Casasent, Tien-Hsin Chao, chairs/editors ; sponsored ... by SPIE--The International Society for Optical Engineering.

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