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Particle characterization in technology. Volume II, Morphological analysis Preview this item
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Particle characterization in technology. Volume II, Morphological analysis

Author: John K Beddow
Publisher: Boca Raton : CRC Press, 2018.
Series: CRC revivals.
Edition/Format:   eBook : Document : EnglishView all editions and formats
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Genre/Form: Electronic books
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: John K Beddow
ISBN: 9781351075367 1351075365 1351083813 9781351083812
OCLC Number: 1020790411
Description: 1 online resource.
Contents: 1. Theory and Method 2. Data analysis 3. Applications
Series Title: CRC revivals.
Other Titles: Morphological analysis
Responsibility: editor, John Keith Beddow.

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