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Physical aspects of electron microscopy and microbeam analysis

Author: Benjamin M Siegel; Donald Robert Beaman; Electron Microscopy Society of America.; Microbeam Analysis Society.
Publisher: New York : Wiley, [1975]
Series: A Wiley biomedical-health publication
Edition/Format:   Print book : EnglishView all editions and formats
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Additional Physical Format: Online version:
Siegel, Benjamin M.
Physical aspects of electron microscopy and microbeam analysis.
New York : Wiley, [1975]
(OCoLC)742307990
Document Type: Book
All Authors / Contributors: Benjamin M Siegel; Donald Robert Beaman; Electron Microscopy Society of America.; Microbeam Analysis Society.
ISBN: 0471790206 9780471790204
OCLC Number: 1085871
Notes: Expanded versions of papers presented at the joint meetings of the Electron Microscopy Society of America and the Microbeam Analysis Society, held in New Orleans, Aug. 14-17, 1973.
"A Wiley biomedical-health publication."
Description: xiii, 474 pages : illustrations ; 26 cm.
Series Title: A Wiley biomedical-health publication
Responsibility: edited by Benjamin M. Siegel and D.R. Beaman.

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