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Principles of analytical electron microscopy

Author: David C Joy; Alton D Romig; Joseph Goldstein
Publisher: New York : Plenum Press, ©1986.
Series: Language of science.
Edition/Format:   Print book : EnglishView all editions and formats
Summary:

All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy,  Read more...

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Document Type: Book
All Authors / Contributors: David C Joy; Alton D Romig; Joseph Goldstein
ISBN: 0306423871 9780306423871
OCLC Number: 13822726
Description: xvi, 448 pages : illustrations ; 26 cm.
Contents: Electron beam-specimen interactions in the analytical electron microscope --
Introductory electron optics --
Principles of image formation --
Principles of X-ray energy-dispersive spectrometry in the analytical electron microscope --
Quantitative X-ray analysis --
EDS quantitation and application to biology --
The basic principles of eels --
Quantitative microanalysis using eels --
Electron microdiffraction --
Barriers to AEM: contamination and etching --
Radiation effects encountered by inorganic materials in analytical electron microscopy --
High-resolution microanalysis and energy-filtered imaging in biology --
A critique of the continuum normalization method used for biological X-ray microanalysis.
Series Title: Language of science.
Responsibility: edited by David C. Joy, Alton D. Romig, Jr., and Joseph I. Goldstein.

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