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Proceedings, Third International Conference on the Economics of Design, Test, and Manufacturing : May 16-17, 1994, Austin, Texas

Author: Tony Ambler; M Abadir; IEEE Computer Society. Test Technology Technical Committee.
Publisher: Los Alamitos, Calif. : IEEE Computer Society Press, ©1996.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Summary:

Focuses on economic analysis in the decision making and application of testing electronic circuits at all levels. The 21 papers, revised for publication, consider such facets as error modeling in a  Read more...

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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Online version:
International Conference on the Economics of Design, Test, and Manufacturing (3rd : 1994 : Austin, Tex.).
Proceedings, Third International Conference on the Economics of Design, Test, and Manufacturing.
Los Alamitos, Calif. : IEEE Computer Society Press, ©1996
(OCoLC)714903744
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Tony Ambler; M Abadir; IEEE Computer Society. Test Technology Technical Committee.
ISBN: 0818665955 9780818665950
OCLC Number: 34941403
Notes: "IEEE Computer Society Press order number PR06595"--Title page verso.
"IEEE order plan catalog number 94TH0701-3"--Title page verso.
Description: viii, 163 pages : illustrations ; 29 cm
Other Titles: Third International Conference on the Economics of Design, Test, and Manufacturing
Proceedings, 3rd International Conference on the Economics of Design, Test, and Manufacturing
Responsibility: sponsored by IEEE Computer Society Technical Committee for Test Technology ; edited by Tony Ambler, Magdy Abadir.

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