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Process capability indices

Author: Samuel Kotz; Norman Lloyd Johnson
Publisher: London ; New York : Chapman & Hall, 1993.
Edition/Format:   Print book : English : 1st edView all editions and formats
Summary:

A comprehensive analysis of the process capability indexes, a new tool for judging potentials of a manufacturing process under statistical control. The book attempts to bridge a gap between  Read more...

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Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Samuel Kotz; Norman Lloyd Johnson
ISBN: 041254380X 9780412543807
OCLC Number: 27641276
Description: x, 212 pages : illustrations ; 23 cm
Contents: 1. Introduction --
1.1. Facts needed from distribution theory --
1.2. Approximations with statistical differentials ('delta method') --
1.3. Binomial and Poisson distributions --
1.4. Normal distributions --
1.5. (Central) chi-squared distributions and non-central chi-squared distributions --
1.6. Beta distributions --
1.7. t-distributions and non-central t-distributions --
1.8. Folded distributions --
1.9. Mixture distributions --
1.10. Multinormal (multivariate normal) distributions --
1.11. Systems of distributions --
1.12. Facts from statistical methodology --
2. The basic process capability indices: C[subscript p], C[subscript pk] and their modifications --
2.2. The C[subscript p] index --
2.3. Estimation of C[subscript p] --
2.4. The C[subscript pk] index --
2.5. Estimation of C[subscript pk] --
2.6. Comparison of capabilities --
2.7. Correlated observations --
2.8. PCIs for attributes --
3. The C[subscript pm] index and related indices --
3.2. The C[subscript pm] index --
3.3. Comparison of C[subscript pm] and C[actual symbol not reproducible] with C[subscript p] and C[subscript pk] --
3.4. Estimation of C[subscript pm] (and C[actual symbol not reproducible]) --
3.5. Boyles' modified C[subscript pm] index --
3.6. The C[subscript pmk] index --
3.7. C[subscript pm](a) indices --
Appendix 3.A: A minimum variance unbiased estimator for W=(9C[actual symbol not reproducible])[superscript-1] --
4. Process capability indices under non-normality: robustness properties --
4.2. Effects of non-normality --
4.3. Construction of robust PCIs --
4.4. Flexible PCIs --
4.5. Asymptotic properties --
5. Multivariate process capability indices --
5.2. Construction of multivariate PCIs --
5.3. Multivariate analogs of C[subscript p] --
5.4. Multivariate analogs of C[subscript pm] --
5.5. Vector-valued PCIs.
Responsibility: Samuel Kotz and Norman L. Johnson.
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