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Quantitative microbeam analysis : proceedings of the Fortieth Scottish Universities Summer School in Physics, Dundee, August 1992

Author: A G Fitzgerald; B E Storey; Derek J Fabian
Publisher: Bristol : Scottish Universities Summer School in Physics ; Philadelphia : Institute of Physics Publishing, [1993] ©1993
Series: SUSSP publications, 40.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Genre/Form: Electronic books
Conference papers and proceedings
Congresses
Additional Physical Format: Print version:
Fitzgerald, A.G.
Quantitative Microbeam Analysis.
London : Routledge, ©1993
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: A G Fitzgerald; B E Storey; Derek J Fabian
ISBN: 9781351420525 1351420526
OCLC Number: 1041059875
Notes: "A Nato Advanced Study Institute."
Description: 1 online resource (xiv, 478 pages) : illustrations.
Contents: Quantification in AES and XPS / M.P. Seah --
Surface Analytical Imaging / M. Prutton --
Electronic Structure and Electron Spectroscopy / G. Van der Laan --
Auger Electron Spectroscopy in the STEM / P. Kruit --
Electron Energy-Loss Spectroscopy --
EELS / R.F. Egerton --
Light Element Microanalysis and Imaging / D.B. Williams --
A Comparison of Quantification Methods and Analytical Techniques / A.G. Fitzgerald --
Data Analysis and Processing / P. Trebbia --
Microscopy and Microanalysis of Insulating Materials / J. Cuzaux --
Electron Specimen Interactions / D.C. Joy --
Electron Probe X-ray Microanalysis / P. Van Espen --
Energy Dispersive X-Ray Analysis (EDX) in the TEM/STEM / J.M. Titchmarsh --
Analysis and Imaging by Proton-Induced X-Ray Emission (PIXE) / J.L. Campbell --
Ion-Beam Analytical Techniques --
Rutherford Backscattering, Elastic Recoil and Nuclear Reaction Analysis / E.A. Maydell --
Quantitative Analysis of Solids by SIMS and SNMS / K. Wittmaack --
Static SIMS / D. Briggs. Applications of Surface, Interface and Thin Film Analysis in an Industrial Research Laboratory / H.W. Werner --
Ion-Induced Auger Electron Emission From Solids / D.J. Fabian --
Resonance Ionisation Mass Spectrometry (RIMS) / K.W. Ledingham.
Series Title: SUSSP publications, 40.
Responsibility: edited by A.G. Fitzgerald, B.E. Storey, D. Fabian.

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Primary Entity

<http://www.worldcat.org/oclc/1041059875> # Quantitative microbeam analysis : proceedings of the Fortieth Scottish Universities Summer School in Physics, Dundee, August 1992
    a schema:Book, schema:MediaObject, schema:CreativeWork ;
    library:oclcnum "1041059875" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/enk> ;
    schema:about <http://dewey.info/class/502.825/e23/> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/1030453403#Topic/electron_microscopy> ; # Electron microscopy
    schema:about <http://experiment.worldcat.org/entity/work/data/1030453403#Topic/electron_probe_microanalysis> ; # Electron probe microanalysis
    schema:about <http://experiment.worldcat.org/entity/work/data/1030453403#Topic/science_general> ; # SCIENCE--General
    schema:bookFormat schema:EBook ;
    schema:creator <http://experiment.worldcat.org/entity/work/data/1030453403#Meeting/scottish_universities_summer_school_in_physics_40th_1992_dundee_scotland> ; # Scottish Universities Summer School in Physics (40th : 1992 : Dundee, Scotland),
    schema:datePublished "1993" ;
    schema:description "Applications of Surface, Interface and Thin Film Analysis in an Industrial Research Laboratory / H.W. Werner -- Ion-Induced Auger Electron Emission From Solids / D.J. Fabian -- Resonance Ionisation Mass Spectrometry (RIMS) / K.W. Ledingham."@en ;
    schema:description "Quantification in AES and XPS / M.P. Seah -- Surface Analytical Imaging / M. Prutton -- Electronic Structure and Electron Spectroscopy / G. Van der Laan -- Auger Electron Spectroscopy in the STEM / P. Kruit -- Electron Energy-Loss Spectroscopy -- EELS / R.F. Egerton -- Light Element Microanalysis and Imaging / D.B. Williams -- A Comparison of Quantification Methods and Analytical Techniques / A.G. Fitzgerald -- Data Analysis and Processing / P. Trebbia -- Microscopy and Microanalysis of Insulating Materials / J. Cuzaux -- Electron Specimen Interactions / D.C. Joy -- Electron Probe X-ray Microanalysis / P. Van Espen -- Energy Dispersive X-Ray Analysis (EDX) in the TEM/STEM / J.M. Titchmarsh -- Analysis and Imaging by Proton-Induced X-Ray Emission (PIXE) / J.L. Campbell -- Ion-Beam Analytical Techniques -- Rutherford Backscattering, Elastic Recoil and Nuclear Reaction Analysis / E.A. Maydell -- Quantitative Analysis of Solids by SIMS and SNMS / K. Wittmaack -- Static SIMS / D. Briggs."@en ;
    schema:editor <http://experiment.worldcat.org/entity/work/data/1030453403#Person/fabian_derek_j> ; # Derek J. Fabian
    schema:editor <http://experiment.worldcat.org/entity/work/data/1030453403#Person/storey_b_e> ; # B. E. Storey
    schema:editor <http://experiment.worldcat.org/entity/work/data/1030453403#Person/fitzgerald_a_g> ; # A. G. Fitzgerald
    schema:exampleOfWork <http://worldcat.org/entity/work/id/1030453403> ;
    schema:genre "Conference publication"@en ;
    schema:genre "Conference papers and proceedings"@en ;
    schema:genre "Electronic books"@en ;
    schema:inLanguage "en" ;
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/1030453403#Series/sussp_publications> ; # SUSSP publications ;
    schema:isSimilarTo <http://worldcat.org/entity/work/data/1030453403#CreativeWork/quantitative_microbeam_analysis> ;
    schema:name "Quantitative microbeam analysis : proceedings of the Fortieth Scottish Universities Summer School in Physics, Dundee, August 1992"@en ;
    schema:productID "1041059875" ;
    schema:url <http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=1683973> ;
    schema:url <http://www.vlebooks.com/vleweb/product/openreader?id=none&isbn=9781351420532> ;
    schema:url <http://public.eblib.com/choice/publicfullrecord.aspx?p=5211921> ;
    schema:workExample <http://worldcat.org/isbn/9781351420525> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/1041059875> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/1030453403#Meeting/scottish_universities_summer_school_in_physics_40th_1992_dundee_scotland> # Scottish Universities Summer School in Physics (40th : 1992 : Dundee, Scotland),
    a bgn:Meeting, schema:Event ;
    schema:location <http://experiment.worldcat.org/entity/work/data/1030453403#Place/dundee_scotland> ; # Dundee, Scotland),
    schema:name "Scottish Universities Summer School in Physics (40th : 1992 : Dundee, Scotland)," ;
    .

<http://experiment.worldcat.org/entity/work/data/1030453403#Person/fabian_derek_j> # Derek J. Fabian
    a schema:Person ;
    schema:familyName "Fabian" ;
    schema:givenName "Derek J." ;
    schema:name "Derek J. Fabian" ;
    .

<http://experiment.worldcat.org/entity/work/data/1030453403#Person/fitzgerald_a_g> # A. G. Fitzgerald
    a schema:Person ;
    schema:familyName "Fitzgerald" ;
    schema:givenName "A. G." ;
    schema:name "A. G. Fitzgerald" ;
    .

<http://experiment.worldcat.org/entity/work/data/1030453403#Person/storey_b_e> # B. E. Storey
    a schema:Person ;
    schema:familyName "Storey" ;
    schema:givenName "B. E." ;
    schema:name "B. E. Storey" ;
    .

<http://experiment.worldcat.org/entity/work/data/1030453403#Place/dundee_scotland> # Dundee, Scotland),
    a schema:Place ;
    schema:name "Dundee, Scotland)," ;
    .

<http://experiment.worldcat.org/entity/work/data/1030453403#Series/sussp_publications> # SUSSP publications ;
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/1041059875> ; # Quantitative microbeam analysis : proceedings of the Fortieth Scottish Universities Summer School in Physics, Dundee, August 1992
    schema:name "SUSSP publications ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/1030453403#Topic/electron_microscopy> # Electron microscopy
    a schema:Intangible ;
    schema:name "Electron microscopy"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/1030453403#Topic/electron_probe_microanalysis> # Electron probe microanalysis
    a schema:Intangible ;
    schema:name "Electron probe microanalysis"@en ;
    .

<http://worldcat.org/entity/work/data/1030453403#CreativeWork/quantitative_microbeam_analysis>
    a schema:CreativeWork ;
    rdfs:label "Quantitative Microbeam Analysis." ;
    schema:description "Print version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/1041059875> ; # Quantitative microbeam analysis : proceedings of the Fortieth Scottish Universities Summer School in Physics, Dundee, August 1992
    .

<http://worldcat.org/isbn/9781351420525>
    a schema:ProductModel ;
    schema:isbn "1351420526" ;
    schema:isbn "9781351420525" ;
    .

<http://www.worldcat.org/title/-/oclc/1041059875>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
    schema:about <http://www.worldcat.org/oclc/1041059875> ; # Quantitative microbeam analysis : proceedings of the Fortieth Scottish Universities Summer School in Physics, Dundee, August 1992
    schema:dateModified "2019-05-10" ;
    void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


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