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Rasterelektronenmkroskopische Untersuchungen von Metallschäden

Author: Lothar Engel; H Klingele
Publisher: München ; Wien : Hanser, ©1982.
Edition/Format:   Print book : German : 2., neubearbeitete AuflView all editions and formats
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Document Type: Book
All Authors / Contributors: Lothar Engel; H Klingele
ISBN: 3446134166 9783446134164
OCLC Number: 10262882
Notes: Includes index.
Description: 264 pages : chiefly illustrations ; .c 25 cm
Responsibility: L. Engel und H. Klingele ; hrsg. vom Gerling Institut für Schadenforschung und Schadenverhütung GmbH. Köln.

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Primary Entity

<http://www.worldcat.org/oclc/10262882> # Rasterelektronenmkroskopische Untersuchungen von Metallschäden
    a schema:Book, schema:CreativeWork ;
    library:oclcnum "10262882" ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/4494932933#Place/wien> ; # Wien
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/gw> ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/4494932933#Place/munchen> ; # München
    schema:about <http://id.worldcat.org/fast/1017922> ; # Metallography
    schema:about <http://id.worldcat.org/fast/1106478> ; # Scanning electron microscopes
    schema:about <http://id.worldcat.org/fast/1018080> ; # Metals--Defects
    schema:about <http://id.loc.gov/authorities/subjects/sh85084182> ; # Metals--Defects
    schema:bookEdition "2., neubearbeitete Aufl." ;
    schema:bookFormat bgn:PrintBook ;
    schema:contributor <http://viaf.org/viaf/32482513> ; # H. Klingele
    schema:copyrightYear "1982" ;
    schema:creator <http://viaf.org/viaf/93114600> ; # Lothar Engel
    schema:datePublished "1982" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/4494932933> ;
    schema:inLanguage "de" ;
    schema:name "Rasterelektronenmkroskopische Untersuchungen von Metallschäden" ;
    schema:productID "10262882" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/10262882#PublicationEvent/munchen_wien_hanser_1982> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/4494932933#Agent/hanser> ; # Hanser
    schema:workExample <http://worldcat.org/isbn/9783446134164> ;
    umbel:isLike <http://d-nb.info/820698652> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/10262882> ;
    .


Related Entities

<http://id.loc.gov/authorities/subjects/sh85084182> # Metals--Defects
    a schema:Intangible ;
    schema:name "Metals--Defects" ;
    .

<http://id.worldcat.org/fast/1017922> # Metallography
    a schema:Intangible ;
    schema:name "Metallography" ;
    .

<http://id.worldcat.org/fast/1018080> # Metals--Defects
    a schema:Intangible ;
    schema:name "Metals--Defects" ;
    .

<http://id.worldcat.org/fast/1106478> # Scanning electron microscopes
    a schema:Intangible ;
    schema:name "Scanning electron microscopes" ;
    .

<http://viaf.org/viaf/32482513> # H. Klingele
    a schema:Person ;
    schema:familyName "Klingele" ;
    schema:givenName "H." ;
    schema:name "H. Klingele" ;
    .

<http://viaf.org/viaf/93114600> # Lothar Engel
    a schema:Person ;
    schema:familyName "Engel" ;
    schema:givenName "Lothar" ;
    schema:name "Lothar Engel" ;
    .

<http://worldcat.org/isbn/9783446134164>
    a schema:ProductModel ;
    schema:isbn "3446134166" ;
    schema:isbn "9783446134164" ;
    .


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