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Reliability mathematics: fundamentals, practices, procedures

Author: Bertram L Amstadter
Publisher: New York, McGraw-Hill [1971]
Edition/Format:   Print book : EnglishView all editions and formats
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Additional Physical Format: Online version:
Amstadter, Bertram L.
Reliability mathematics: fundamentals, practices, procedures.
New York, McGraw-Hill [1971]
(OCoLC)610306720
Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Bertram L Amstadter
ISBN: 0070015988 9780070015982
OCLC Number: 107645
Description: viii, 408 pages 23 cm
Contents: Machine derived contents note: Preface iii --
1. INTRODUCTION 1 --
2. FUNDAMENTAL STATISTICAL CONCEPTS 13 --
3 DISTRIBUTIONS USED IN RELIABILITY 27 --
4. TESTS OF HYPOTHESES 50 --
5. RELATED STATISTICAL PROCEDURES 71 --
6. DATA CONSIDERATIONS 92 --
7. LOGIC DIAGRAMS 106 --
8. MATHEMATICAL MODELS 121 --
9. PREDICTION OF COMPONENT RELIABILITY 149 --
10. SYSTEM PREDICTION 166 --
11. APPORTIONMENT 193 --
12. RELIABILITY GROWTH 220 --
13. ASSESSMENT METHODS: ATTRIBUTES 242 --
14. ASSESSMENT METHODS: VARIABLES 252 --
15. RELIABILITY DEMONSTRATION 278 --
16. SYSTEM RELIABILITY CONSIDERATIONS 290 --
Appendix A. MATHEMATICAL DERIVATIONS 309 --
A.1 Derivation of Eqs. (5.3) and (5.4) 311; A.2 Proof of equivalence --
of Eqs. (5.6), (5.7a), and (5.7b) 312; A.3 Derivation of Eq. (8.12) --
and further application of L'Hospital's rule 313; A.4 Derivation of --
Eq. (8.40) 315; A.5 Proof of Eq. (8.44) 320; A.6 Transformation --
of equation for three-unit sequential systems to form showing reliability --
contributed by each unit as in Eq. (8.40) 322 --
Appendix B. STATISTICAL TABLES 327 --
B.1 Values of the negative exponential 329; B.2 Areas of the normal --
curve 334; B.3 Values of the t distribution 335; B.4 Percentiles --
of the chi-square distribution 336; B.5 Percentiles of the chi-square/ --
d.f. distribution 338; B.6 Values of the F distribution 340; B.7 --
Squares and square roots 348 --
Appendix C. RELIABILITY TABLES 353 --
C.1 Reliability of active parallel redundant systems 355 --
C.2 Reliability determined from number of tests and number of failures --
at: a. 50 percent confidence 358; b. 75 percent confidence 359; --
c. 90 percent confidence 360; d. 95 percent confidence 361; --
e. 99 percent confidence 362 --
C.3 Reliability determined from number of equivalent missions and --
number of failures at: a. 50 percent confidence 364; b. 75 percent --
confidence 366; c. 90 percent confidence 368; d. 95 percent --
confidence 370; e. 99 percent confidence 372 --
C.4 Reliability determined from safety margins computed from: a. 3 --
sample units 375; b. 4 sample units 376; c. 5 sample units 377; --
d. 6 sample units 378; e. 7 sample units 379; f. 8 sample units --
380; g. 9 sample units 381; h. 10 sample units 382; i. 12 --
sample units 383; j. 15 sample units 384; k. 20 sample units --
385; /. 25 sample units 386; m. 30 sample units 387; n. 40 --
sample units 388; o. 50 sample units 389; p. 60 sample units --
390; q. 80 sample units 391; r. 100 sample units 392; s. 250 --
sample units 393 --
C.5 Failure-rate-data sources 394.
Responsibility: [by] Bertram L. Amstadter.
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